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A method and system for NVMe SSD hot swap test

A hot-swapping and hot-inserting technology, which is applied in the direction of faulty hardware testing methods, faulty computer hardware detection, and use of power-on test to detect faulty hardware. Problems such as hot-swapping test data to achieve the effect of reducing the consumption of manpower and material resources and improving test efficiency

Inactive Publication Date: 2018-12-18
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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AI Technical Summary

Problems solved by technology

[0004] The current NVMe SSD hot-swap test is basically a manual test, the test efficiency is low, the number of tests is small, and the effective test results are few, and it is impossible to quickly obtain effective NVMe SSD hot-swap test data on a large scale; It is impossible to timely warn and record the relevant problems encountered, and can only obtain broad test data such as the probability of success, which cannot provide guarantee for the reliability of hot-swapping products

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  • A method and system for NVMe SSD hot swap test
  • A method and system for NVMe SSD hot swap test
  • A method and system for NVMe SSD hot swap test

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Embodiment Construction

[0042] The core of the present application is to provide a method, system, device and computer-readable storage medium for NVMe SSD hot-plug testing, which are used to complete the automated testing of NVMe SSD hot-plug.

[0043] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0044] Please refer to figure 1 , figure 1 It is a flow chart of a method for NVMe SSD hot swap testing provided by the embodime...

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Abstract

The invention discloses an NVMe SSD hot plug test method, which comprises the following steps: a host terminal receives an input test command; Controlling the power supply of the NVMe SSD to be turnedon or off according to the test command to simulate the insertion or removal of the NVMe SSD, where the NVMe SSD is powered by an independent power supply; The test program is executed to test the host terminal, and the obtained test results are recorded as hot insertion test results or hot pull-out test results correspondingly. Output hot insert test results and / or hot pull test results. The application does not require manual testing or mechanical plug-and-pull testing, greatly reducing the consumption of human and material resources, having high test efficiency, and being capable of obtaining effective NVMe SSD hot-plug test data on a large scale and quickly. The present application also provides a system, device and computer readable storage medium for NVMe SSD hot swap test, which has the above beneficial effects.

Description

technical field [0001] The present application relates to the field of automatic testing, in particular to a method, system, device and computer-readable storage medium for NVMe SSD hot-plug testing. Background technique [0002] In the era of cloud computing, massive amounts of data need to be stored and read. The Non-Volatile Memory Express Solid State Disk (NVMe SSD) introduces relatively excellent input / output performance and quickly become a key component of storage. [0003] The NVMe SSD is directly connected to the general-purpose PCIe bus, and the controller of the NVMe SSD is inside the drive and will be deleted when the SSD is removed. The hot-swapping process completely depends on the PCIe hot-swapping processing mechanism of the operating system. If the support for hot swap is not easy to use, it is easy to cause system abnormality and business interruption. Therefore, testing the system reliability of hot plugging of flash memory products has become a key busi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2221G06F11/2273G06F11/2284
Inventor 亓浩赵帅张雪庆王洋
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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