SIW-based portable liquid dielectric constant measurement system
A technology of dielectric constant and measurement system, which is applied in the direction of dielectric property measurement, measurement device, and measurement of electrical variables, etc., which can solve the problems of large volume, high price and high cost of resonant frequency, and achieve the effect of reducing cost and improving convenience
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0021] The following are specific embodiments of the present invention and in conjunction with the accompanying drawings, the technical solutions of the present invention are further described, but the present invention is not limited to these embodiments.
[0022] see figure 1 , The embodiment portable dielectric constant measurement system is a PLL circuit composed of a feedback VCO connected to the SIW resonant cavity.
[0023] The feedback VCO circuit connected to the SIW resonant cavity includes the SIW resonant cavity, the first to fourth microstrip lines, capacitors C3-C5, resistor R2, field effect transistor, and varactor Cv(1);
[0024] The SIW resonator consists of a dielectric substrate (7) and metal layers arranged on the upper and lower surfaces of the dielectric substrate; a number of metal through holes (3) are opened on the periphery of the dielectric substrate and the upper and lower metal layers, and a A non-metallic through hole is used to place the medium ...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com