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Techniques to reduce read-modify-write overhead in hybrid dram/nand memory

一种存储器、预读取的技术,应用在存储器系统、仪器、内存架构访问/分配等方向,能够解决长等待时间等问题

Active Publication Date: 2018-10-23
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, certain types of flash memory (eg, ZNAND) may have significantly longer latency for read and write operations than can be achieved using DRAM technology

Method used

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  • Techniques to reduce read-modify-write overhead in hybrid dram/nand memory
  • Techniques to reduce read-modify-write overhead in hybrid dram/nand memory
  • Techniques to reduce read-modify-write overhead in hybrid dram/nand memory

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Embodiment Construction

[0031] Features of the inventive concept and a method of realizing the same can be more easily understood by referring to the following detailed description of the embodiments and accompanying drawings. Hereinafter, embodiments will be described in more detail with reference to the accompanying drawings, wherein like reference numerals designate like elements throughout. However, the invention may be embodied in various different forms and should not be construed as limited to only the embodiments set forth herein. Rather, these embodiments are provided as examples so that this disclosure will be thorough and complete, and will fully convey the aspects and features of the invention to those skilled in the art. Accordingly, processes, elements, and techniques that are not necessary for a person of ordinary skill in the art to fully understand the aspects and features of the invention may not be described. Unless otherwise stated, like reference numerals denote like elements th...

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PUM

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Abstract

A method of choosing a cache line of a plurality of cache lines of data for eviction from a frontend memory is provided. The method includes steps: assigning a baseline replacement score to each way of a plurality of ways of a cache, the ways respectively storing the cache lines; assigning a validity score to each way based on a degree of validity of the cache line stored in each way; assigning aneviction decision score to each way based on a function of the baseline replacement score for the way and the validity score for the way; and choosing a cache line of the way having a highest eviction decision score as the cache line for eviction.

Description

technical field [0001] Some embodiments of the present disclosure relate generally to memory device structures, and to methods of memory device management. Background technique [0002] In the field of memory storage, data centers storing large amounts of memory try to achieve high capacity, high performance, low power usage, and low cost. Flash memory may be a viable candidate for data centers because it can provide high capacity and efficient power usage at a reduced cost compared to dynamic random access memory (DRAM). Flash memory, for example, is capable of delivering gigabytes of storage capacity per module, 10 times the capacity achievable using DRAM technology. Also, flash memory uses lower standby power. [0003] Unfortunately, flash memory generally offers weaker performance compared to DRAM, while also having more limited endurance. For example, certain types of flash memory (eg, ZNAND) may have significantly longer latencies for read and write operations than ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F12/0877G06F12/0888
CPCG06F12/0877G06F12/0888G06F12/0868G06F12/127G06F2212/1024G06F2212/214G06F2212/6022Y02D10/00G06F12/0897G06F13/1673G06F12/121G06F2212/1041G06F13/16
Inventor 张牧天南喜铉金暎植赵永进牛迪民郑宏忠
Owner SAMSUNG ELECTRONICS CO LTD
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