Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Dual redundant decoding drive circuit for satellites to prevent single point failure, and medium

A decoding circuit and a single-point failure technology are applied in the application of error detection coding of multiple parity bits, error correction/detection, and encoding using block codes, which can solve single-point failures that are difficult to meet the high requirements of satellite systems. Reliability requirements, command output failures and other issues, to achieve the effect of ensuring reliability, preventing internal circuit damage, and preventing output of wrong commands

Inactive Publication Date: 2018-10-19
BEIJING MXTRONICS CORP +1
View PDF7 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Affected by space particles during the satellite’s in-orbit operation, various single-event effects often occur in the command decoding drive circuit built with discrete combinational logic devices, including single-event transient pulse (SET), single-event latch-up (SEL), single-event Particle grid penetration (SEGR), etc., are likely to cause single point failures and lead to command output failures, which are difficult to meet the high reliability requirements of satellite systems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dual redundant decoding drive circuit for satellites to prevent single point failure, and medium
  • Dual redundant decoding drive circuit for satellites to prevent single point failure, and medium
  • Dual redundant decoding drive circuit for satellites to prevent single point failure, and medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054]The invention relates to a dual redundant decoding drive circuit for preventing single-point failure for satellites, comprising a dual redundant decoding circuit and a dual redundant output drive circuit. The dual redundant decoding circuit is composed of two independent decoding circuits with the same structure, they share a set of input signals, perform decoding respectively, and output two sets of independent decoding signals to complete the dual redundant decoding function and As the control signal of the dual-redundant output drive circuit of the subsequent stage; the dual-redundant output drive circuit adopts the structure of 4 PMOS output drive tubes of "two parallels and two series", which are controlled by two independent decoding signals of the previous stage. When all the output PMOS transistors are turned on, the output is high level, and the circuit can also output normally when a single PMOS transistor is open or short-circuited. The double-redundant decodi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a dual redundant decoding drive circuit for satellites to prevent single point failure, and a medium. The circuit includes a dual redundant decoding circuit and a dual redundant output drive circuit. The dual redundant decoding circuit consists of two decoding circuits which have the same structures and are independent with each other; the decoding circuits share a set ofinput signals, separately perform decoding to output two sets of independent decoding signals so that the dual redundant decoding function can be accomplished, and the decoding signals can be used ascontrol signals of a post stage dual redundant output drive circuit; the dual redundant output drive circuit adopts four PMOS output driving tube structures that two of the structures are in parallelconnection and the other two are in series connection; the dual redundant output drive circuit can be controlled by the two sets of independent front stage decoding signals; the output can be the highlevel only when the output PMOS tubes in series are conducted; and the circuit can output normally when a single PMOS tube is in open-circuit or short-circuit state. The dual redundant decoding and dual redundant decoding output drive structure can effectively avoid single point failure, enhance the reliability of the circuits and ensure the correction of output instructions.

Description

technical field [0001] The invention belongs to the field of integrated circuits, and relates to a command decoding drive circuit for satellites, in particular to a double-redundant decoding drive circuit and medium for preventing single-point failures for satellites. The application of dual redundant backup with point failure. Background technique [0002] The command decoding drive circuit is the core component of the satellite remote control subsystem. Most of the command actions it outputs are key actions related to the success or failure of the satellite, such as the deployment of solar panels and the detonation of pyrotechnics. Therefore, the reliability requirements for it are very high. [0003] Affected by space particles during the satellite’s in-orbit operation, various single-event effects often occur in the command decoding drive circuit built with discrete combinational logic devices, including single-event transient pulse (SET), single-event latch-up (SEL), si...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M13/11
CPCH03M13/1105
Inventor 蒋敏强权海洋张奇荣张龙吴开云赵忠燕
Owner BEIJING MXTRONICS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products