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Method for measuring critical voltage of solid-liquid interface slip under electric field

A technology of solid-liquid interface and critical voltage, which is applied in the direction of measuring device, surface tension analysis, surface/boundary effect, etc., to achieve the effect of simple operation process, low cost and accurate data results

Active Publication Date: 2018-10-19
四川民惠科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When the solid-liquid interface force is equal to the maximum friction force of the solid-liquid interface for the first time, the corresponding voltage is the critical voltage of the solid-liquid interface slip

Method used

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  • Method for measuring critical voltage of solid-liquid interface slip under electric field
  • Method for measuring critical voltage of solid-liquid interface slip under electric field
  • Method for measuring critical voltage of solid-liquid interface slip under electric field

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Embodiment Construction

[0050] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0051] A method for calculating the slip critical voltage of a solid-liquid interface under an electric field, comprising the steps of:

[0052] Step 1. Coating the surface with 300nm SiO 2 The coated silicon wafer is cut into a standard sample of 20mm*20mm to obtain a solid test sample, and then the solid test sample is ultrasonically cleaned for 5 minutes and dried until the surface of the solid test sample is clean, and the surface is kept clean. The clean solid test sample is placed on a desktop glue leveler, spin-coated with Teflon AF1600 emulsion, spin-coated at a low speed of 500r / min for 20s, and high-speed 3000r / min for 30s, and then put the spin-coated solid test sample in an oven at 200 degrees Celsius Baking for 3 hours, and then naturally cooling to obtain the standard test sampl...

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Abstract

The invention discloses a method for measuring a critical voltage of a solid-liquid interface slip under an electric field, and the method can be used for measuring the critical voltage when the solid-liquid interface slip occurs in the presence of a frictional force under the electric field. The method for measuring the critical voltage is as follows: using a contact angle measuring instrument toobtain advancing angle values of a droplet to be tested under different voltages using an increasing method to obtain apparent contact angle values under different voltages, calculating a maximum solid-liquid interface acting force and a maximum solid-liquid interface friction force according to a formula, and comparing the maximum solid-liquid interface acting force and the maximum solid-liquidinterface friction force to obtain the critical voltage when the solid-liquid interface slip occurs, when the solid-liquid interface acting force is equal to the maximum solid-liquid interface friction force for the first time, the corresponding voltage is the critical voltage of the solid-liquid interface slip. The method is simple in test, data required for the whole test can be measured by thecontact angle measuring instrument, the operation is simple, and test results are accurate.

Description

technical field [0001] The invention belongs to the technical field of microfluidic control systems, and in particular relates to a method for measuring the slip critical voltage of a solid-liquid interface under an electric field. Background technique [0002] Microfluidic control system is an important research content of microelectromechanical systems, which can realize functions such as separation, merging, transportation, and mixing of microfluids, and is widely used in analytical chemistry, biomedicine, diagnostics, and pharmacology. Conventional microfluidic control systems operate and control microdroplets through micropumps and microvalves. With the vigorous development of microfluidic control system technology, conventional microfluidic control systems are facing problems such as complex structure, difficult processing, the need for mechanical pumps and valves, difficulty in integration, wear of mechanical parts, and short service life. Miniaturization, integratio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N13/02
CPCG01N13/02G01N2013/0208
Inventor 张亚锋王永宁吴晓兰姚永瑰余家欣何洪涂
Owner 四川民惠科技有限公司
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