Contact type semiconductor material test head
A material testing and semiconductor technology, applied in single semiconductor device testing, semiconductor characterization, electrical measurement, etc., can solve the problems that the probe pressure reproducibility cannot achieve high precision, it is difficult to reduce the probe spacing, and affect the test results, etc. Achieve the effects of stable and reliable probe force, high probe pressure accuracy, and no sluggish zone
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0027] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with specific examples. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.
[0028] A contact type semiconductor material testing head comprises a housing 1 and a probe assembly 2 arranged in the housing 1 .
[0029] The probe assembly 2 includes a flat extension spring 3 and a probe 4, and the flat extension spring 3 is bilaterally symmetrical, and the flat extension spring 3 includes a lower spring end 31 and an upper extension end 32, and the extension end 32 The spring end 31 includes spring parts 311 on both sides and a middle part 312 ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com