PCIE card test protection fixture, PCIE card test structure and PCIE card test method

Abstract

The invention provides a PCIE card test protection fixture, a PCIE card test structure and a PCIE card test method. The method comprises steps of inserting a PCIE card to be tested into a slot connector of a PCIE card test protection fixture; inserting a motherboard connection section of the PCIE card test protection fixture in a PCIE slot of a motherboard; testing the PCIE card to be tested; andafter the test is complete, removing the motherboard connection section of the PCIE card test protection fixture from the PCIE slot of the motherboard. The PCIE card test protection fixture is connected to the motherboard in an insertion manner, which realizes the purpose of protecting the golden finger of the PCIE card to be tested, and can effectively prevent the short circuit of the PCIE card.The golden finger of the PCIE card is protected from oxidation, and the risk of repeated wear and tear and short circuit of the golden finger of the PCIE card is avoided.

Description

technical field [0001] The invention relates to the field of PCIE card testing, in particular to a PCIE card testing protective fixture, testing framework and testing method. Background technique [0002] In the laboratory test or factory test of the prior art, since it is necessary to conduct all-round functional test verification on different projects and different motherboards, it is necessary to repeatedly plug and unplug the materials such as PCIE cards, and the number of plugs and plugs is too many It will cause the gold fingers to wear out, and after a long time, there will be poor contact or even damage, and there is a risk of short circuiting the board when plugging and unplugging. This not only affects the normal carrying out of the test, but also makes the valuables such as the PCIE card scrapped, causing certain economic losses. Contents of the invention [0003] In order to overcome the deficiencies in the above-mentioned prior art, the present invention prov...

AI Technical Summary

Problems solved by technology

[0002] In the laboratory test or factory test of the prior art, since it is necessary to conduct all-round functional test verification on different projects and different motherboards, it is necessary to repeatedly plug and unplug the materials such as PCIE cards, and the number of plugs and plugs is too many It will cause the gold finger to wear out, and it will cause poor contact or even damage after a long time, and there is a risk of short circuit of the board when plugging and unplugging

This will not only affect the normal progress of the test, but also make such valuables as PCIE cards scrapped, causing certain economic losses.

Images