Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

TIADC system error estimation and compensation method based on sine wave fitting

A technology of sinusoidal fitting and systematic error, applied in the direction of physical parameter compensation/prevention, analog/digital conversion calibration/test, electrical components, etc., to achieve the effect of excellent degree of improvement and good effectiveness

Active Publication Date: 2018-09-04
SOUTHEAST UNIV
View PDF3 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this type of method is not as accurate as the digital method in terms of error compensation accuracy, and is greatly affected by temperature and process changes

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • TIADC system error estimation and compensation method based on sine wave fitting
  • TIADC system error estimation and compensation method based on sine wave fitting
  • TIADC system error estimation and compensation method based on sine wave fitting

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0028] Such as figure 2 As shown, the present invention has designed a kind of TIADC system error estimation and compensation method based on sinusoidal fitting, and the system based on this method is as figure 1 As shown, the principle is to estimate the channel error in the TIADC system based on the sinusoidal fitting method, and to compensate the bandwidth mismatch by designing a fractional delay filter of the Farrow structure, thereby improving the overall performance of the TIADC system. This method specifically comprises the following steps:

[0029] Step 1. For gain mismatch g i and offset mismatch os i Estimation, including: input a low-frequency sinusoidal signal of known frequency to TIADC, obtain the sampling output y[n] of TIADC, and solve the estimated values ​​of the three parameters A, B, and C in the sinusoidal signal according to the sinusoi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a TIADC system error estimation and compensation method based on sine wave fitting. The TIADC system error estimation and compensation method comprises steps that a low frequency sinusoidal signal of a provided frequency is input in the TIADC, and estimated values of three parameters are solved, and amplitudes and offsets of sinusoidal outputs of various channels are calculated; the gain mismatches and the offset mismatches of the residual channels are acquired, and are calculated to complete compensation; a high frequency sinusoidal signal of a provided frequency is input in the TIADC, and after the three parameters are acquired, the amplitude values and the phase values of the sinusoidal outputs of the time-skew errors and the bandwidth mismatches of the various channels are calculated; the channel bandwidths, the phase values caused by the bandwidth mismatches, and the phase values caused by the time-skew errors are estimated; phase adjustment is carried outby adopting a variable delay line and a fractional delay filter to compensate the phase errors caused by the time-skew errors and the bandwidth mismatches. The accurate estimation and the accurate compensation of the errors caused by the various mismatches of the TIADC are realized without being limited by the number of channels, and therefore good effectiveness, wide application, and practicability are realized.

Description

technical field [0001] The invention relates to a sine fitting-based TIADC system error estimation and compensation method, belonging to the technical field of high-speed analog-to-digital converters. Background technique [0002] With the advancement of technologies such as electronic information, the application fields of ADCs continue to expand, and the system's requirements for ADCs continue to increase, so analog-to-digital converters have become the key to improving the speed of communication systems. For high-speed digital signal applications, the conversion rate of the ADC is also limited, and it is increasingly difficult for single-channel ADCs to meet the requirements of high-speed systems. Therefore, how to use the existing ADC to realize a high-speed and high-precision data acquisition system is of great significance. [0003] Multi-channel ADC parallel working sampling is an effective method to achieve higher sampling rate and high-precision ADC, that is, to us...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03M1/10H03M1/06
CPCH03M1/0604H03M1/1014
Inventor 吴建辉李鑫黄成李红闵嘉炜
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products