Testability analysis method and device for electronic equipment

A technology for testing analysis and electronic equipment, applied in design optimization/simulation, special data processing applications, CAD numerical modeling, etc., can solve problems such as difficult promotion and difficult test work

Active Publication Date: 2021-07-13
北京国基科技股份有限公司
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  • Abstract
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Problems solved by technology

Testability modeling and analysis based on multi-signal flow between products makes the testability work more difficult and difficult to promote

Method used

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  • Testability analysis method and device for electronic equipment
  • Testability analysis method and device for electronic equipment
  • Testability analysis method and device for electronic equipment

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Embodiment Construction

[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0043] Considering the special requirements of electronic system (equipment) testability, in order to improve the ability of modern electronic system (equipment) testability analysis, this paper proposes a testability analysis method for electronic equipment, the flow chart of this method is as follows figure 1 As shown, the method includes:

[0044] Step 101: Determine multiple functions to be realized by the electronic equipment to be construc...

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Abstract

The present invention provides a testability analysis method and device for electronic equipment, including: determining multiple functions to be realized by the electronic equipment to be constructed; determining the information flow relationship between multiple functions; Establish a hardware component set for multiple hardware components; determine the signal flow relationship between multiple hardware components according to the information flow relationship between multiple functions; build a hardware component set based on the signal flow relationship between multiple hardware components A multi-signal flow graph model; determining the testability index of the hardware component set according to the multi-signal flow graph model of the hardware component set; analyzing whether the testability index of the hardware component set meets the electronic equipment construction conditions. The method of the invention greatly reduces the establishment of a testable multi-signal flow model at the hardware level by analyzing the information flow at the functional level. At the functional level, you can understand the testability status, assist system personnel in considering testability, reduce the difficulty of testability work, and facilitate promotion.

Description

technical field [0001] The invention relates to the technical field of electronic equipment design, in particular to a testability analysis method and device for electronic equipment. Background technique [0002] Testability (Testability, also translated as testability) is a design feature that a product can accurately determine its state (workable, non-workable, performance degradation) in a timely manner and isolate its internal faults. In the prior art, the testability analysis of the designed products is generally carried out, thereby reducing the use and maintenance costs. For example, according to the investigation of the US Navy, F / A-18, F-14, A-16E and S-3A Technological improvements in testability for 239 key components of four major Navy aircraft reduced their operating and maintenance costs by 30 percent. The above describes the testability analysis of the key components of the aircraft after the design of the aircraft to reduce the cost of use and maintenance. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F111/10
CPCG06F30/20G06F2111/10
Inventor 徐志华何代钦朱勤董国卿张志昌
Owner 北京国基科技股份有限公司
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