Digital waveform testing system and digital waveform generating method of integrated circuit tester

Abstract

The invention discloses a digital waveform testing system and digital waveform generating method of an integrated circuit tester. The method comprises reading and sending a data generating command toa driving chip; setting the bit widths N and depths of FIFOs in a vector waveform generating module and a switch information generating module according to a set transmitter rate and a transmitter bitwidth; causing the set rate Rate to determine the resolution of the waveform data and the switch data as 1 / Rate, causing the data of an N-bit width to represent the data in a N / Rate time length, reading a cycle T and edge positioning information D1 and D2, dividing data in one cycle into T*Rate / N pieces of data to be successively saved in the waveform data; setting the transmitter rate and bit width to be the same, reading the cycle and the edge positioning information D0 and D3, dividing the switch information in one cycle into T*Rate / N d pieces of data to be successively stored in the switch data; while data is written into the FIFO, reading the waveform data and the switch data according to pipeline operation, and sending drive data through the transmitter.

Description

technical field [0001] The invention relates to a digital waveform testing system and a generating method of an integrated circuit tester, belonging to the field of digital integrated circuit testers. Background technique [0002] Digital integrated circuit tester is a special instrument for testing integrated circuits. It tests DUT function, DUT DC parameters and AC parameters by sending vector test waveforms. It mainly relies on ASIC or programmable logic devices + peripheral high-precision devices to generate waveforms with a precision of 100 ps or even higher precision to measure various indicators of the DUT; the usual methods are either long development time and high cost, or the device takes up too much Large size and high power consumption. Contents of the invention [0003] In view of the above problems, the present invention provides a digital waveform test system and a generation method of an integrated circuit tester with short development time, low cost, smal...

AI Technical Summary

Problems solved by technology

It mainly relies on ASIC or programmable logic devices + peripheral high-precision devices to generate waveforms with a precision of 100 ps or even higher precision to measure various indicators of the DUT; the usual methods are either long development time and high cost, or the device takes up too much Large size and high power consumption

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