Active information assembly test device and test method

Abstract

The invention provides an active information assembly test device and a test method. The test device comprises n test input interfaces, which are connected to n input ends of m paths of switching switches in a one-to-one correspondence manner. The test input interfaces are in one-to-one correspondence with n pull-down resistors R and are connected to a negative power source; and the n test input interfaces and the n pull-down resistors R are connected to form n A nodes. The n input ends of the m paths of switching switches are in one-to-one correspondence with n pull-up resistors r and are connected to a positive power source; and the n input ends and the n pull-up resistors r are connected to form n B nodes. Series resistor Z, totally n series resistor Z, are connected in series between the A nodes and the B nodes, which are in one-to-one correspondence. The active information assembly test device and test method can conveniently realize test of whether a tested assembly is damaged, and ensure that new damage is not done to the tested assembly in the signal acquisition and test process.

Description

technical field [0001] The invention relates to an active information component testing device and a testing method, and relates to the field of component testing. Background technique [0002] Active signal components: plugged or soldered on other circuit boards, referring to circuit components that require external power supply and can communicate with the outside, such as WIFI components, GPS components, Bluetooth components, tuner components, etc., the common feature is that they need power Supply, can process and output the input signal, can carry out handshake communication with the external controller, and execute the corresponding command. [0003] In the production process of active signal components, it needs to go through four process links: patching, assembly, testing, and packaging. Among them, the testing link is a key process link, which needs to verify whether the performance and quality of the components meet the specification requirements. [0004] In the ...

AI Technical Summary

Problems solved by technology

[0013] 1) When performing a performance test on a component, it is necessary to normally power on and initialize the component under test. After the test is completed, the component needs to be powered off. Due to the grounding of the test fixture, power supply performance, and irregular power-on or power-off processes, etc. , a certain proportion will cause damage to the devices connected to the component pin ports inside the component under test, and these damages may be dominant damage or hidden damage

[0014] Overt damage may directly lead to performance degradation or damage of the component under test, and a certain percentage will be discovered by subsequent performance testing stations. For hidden damage, it will not affect the performance of the component under test in a short period of time, and it is difficult to be discovered before the component leaves the factory.

[0015] 2) Before the component under test enters the testing process, it has already gone through the process of patching and assembly. Due to operational errors, there is a certain probability of component damage. For hidden damage, it is difficult to be detected by subsequent performance because it does not appear in a short period of time. test process discovery

[0021] 2) Inefficient testing

[0022] Using a digital multimeter to measure, only one pin of the component under test can be measured at a time, the test efficiency is low, and it is not suitable for mass production;

[0023] 3) Not suitable for components with many pins to be tested

[0024] For components with many external pins and small pin spacing, such as WIFI components, GPS components, etc., it is difficult to test them with a multimeter;

[0025] 4) The test results are difficult to save and cannot be traced

[0026] Ordinary digital multimeter, as an independent measuring instrument, does not support external control, data exchange and other operations, and can only rely on manual operation, reading data and discrimination, the test data cannot be saved, and the test results cannot be traced;

[0027] 5) It is easy to cause test misjudgment

[0028] Using a digital multimeter for measurement operations cannot detect operational errors during the operation, and manual judgment is used, which can easily lead to test misjudgments

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