Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical refractive index change-based ultra-wideband neutron detector

A technology of refractive index change and neutron detectors, which is applied in the field of nuclear radiation detection, can solve the problems of limited detection system time resolution, attenuation and loss of high-frequency signal components, and achieve easy integration and miniaturization, high time resolution The effect of simple production method

Pending Publication Date: 2018-04-10
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is based on the electronic detection system. For pulsed neutron beam detection, during the process of excitation, generation of pulse current or voltage, and transmission, the high-frequency components in the pulse current or voltage signal will be limited by the bandwidth of the electronic detection system, resulting in signal High-frequency components are attenuated or even lost, which severely limits the time resolution capability of the detection system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical refractive index change-based ultra-wideband neutron detector
  • Optical refractive index change-based ultra-wideband neutron detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0022] This embodiment provides an ultra-broadband neutron detector based on optical refractive index changes, see the attached figure 1 , including: a detection unit with a four-layer structure composed of a sequentially fixed hydrocarbon material layer 2, a cesium iodide layer 3, a semiconductor 4 and a substrate 5, a high-voltage power supply 7 and a neutron beam 9;

[0023] See attached figure 2 , the neutron detector, laser 11, beam splitting prism 12, mirror 13 and optical detector 14 form a Michelson interferometer for measuring optical refractive index changes;

[0024] The substrate 5 in the detection unit is the supporting structure of the detection unit, and the first metal film 1 and the second metal film 6 are respectively electroplated on the outer surfaces of the hydrocarbon material layer 2 and the substrate 5; the second metal film 6 is...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an optical refractive index change-based ultra-wideband neutron detector and belongs to the technical field of nuclear radiation detection. The optical refractive index change-based ultra-wideband neutron detector comprises a detection unit composed of a hydrocarbon material layer, a cesium iodide layer, a semiconductor and a substrate which are sequentially fixed, a high-voltage power supply and a neutron beam. A first metal film and a second metal film are respectively electroplated on the outer surface of the hydrocarbon material layer and the outer surface of the substrate. The first metal film is electrically connected with the negative electrode of the high-voltage power supply. After the neutron beam is incident on the detection unit, neutrons collide with protons in the hydrocarbon material layer to generate back-flushing protons. The back-flushing protons enter the cesium iodide layer to generate free electrons. Under the electric field action of a negative high voltage between the first metal film and the second metal film, generated free electrons in the cesium iodide layer are injected into the semiconductor, so that the optical refractive indexof the semiconductor is changed. The detector can convert the neutron beam into the refractive index change of the semiconductor material. Based on the optical interference, the refractive index change of the semiconductor material is measured, and then the intensity information of the neutron beam is obtained.

Description

technical field [0001] The invention belongs to the technical field of nuclear radiation detection, and in particular relates to an ultra-broadband neutron detector based on optical refractive index changes. Background technique [0002] Neutron detection is one of the important research contents in the field of nuclear radiation detection. The traditional neutronics detection method is to use the detection material to interact with the neutron beam to generate free electrons, and to collect these free electrons to generate current or voltage for detection. This method is based on the electronic detection system. For pulsed neutron beam detection, during the process of excitation, generation of pulse current or voltage, and transmission, the high-frequency components in the pulse current or voltage signal will be limited by the bandwidth of the electronic detection system, resulting in signal High-frequency components are attenuated or even lost, which severely limits the t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01T3/00G01T3/08
CPCG01T3/00G01T3/08
Inventor 易涛苏明
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products