An analog circuit fault diagnosis method based on cross-wavelet characteristics

Abstract

The invention provides an analog circuit fault diagnosis method based on cross-wavelet characteristics. The method comprises the following steps: inputting an excitation signal to a tested analog circuit, collecting time-domain response output signals and constructing an original data sample set; dividing the original data sample set into a training sample set and a test sample set; carrying out cross wavelet decomposition on the training sample set and the test sample set to obtain a wavelet cross spectrum of the training sample set and the test sample set; carrying out processing on the wavelet cross spectrum of the training sample set and the test sample set through bidirectional two-dimensional linear discriminant analysis, and extracting fault feature vectors of the training sample set and the test sample set; submitting the fault feature vectors of the training sample set to a support vector machine for training an SVM classifier, and constructing a support vector machine fault diagnosis model; and inputting the fault feature vectors of the test sample set to the model and carrying out fault classification. The method can effectively identify the fault of the analog circuit,and obviously improve fault diagnosis precision of the analog circuit.

Description

technical field [0001] The invention belongs to the technical field of circuit testing, in particular to an analog circuit fault diagnosis method based on cross wavelet features. Background technique [0002] With the development of microelectronics technology, large-scale digital-analog hybrid integrated circuits are widely used in electronic products, industrial control, communication equipment and other fields. As an important part of the integrated circuit, the analog circuit transmits, filters, amplifies, and converts signals, which are necessary functions for the normal operation of the system. Therefore, it is extremely necessary to carry out research on fault diagnosis technology for analog circuits to ensure the reliability of the system. [0003] However, due to the difficulty in constructing analog circuit fault simulation, the nonlinearity and tolerance of circuit components, analog circuit fault diagnosis still faces many problems. For example, the interferenc...

AI Technical Summary

Problems solved by technology

However, the performance of the fault diagnosis method is not considered in the case of multiple faults, that is, when the fault categories overlap greatly.

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