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Magnetometer calibration method and device

A calibration method and magnetometer technology, applied in measuring devices, measuring magnetic variables, instruments, etc., can solve problems such as inability to judge, achieve the effects of environmental stability, elimination of instrument errors, and comprehensive standard parameters

Active Publication Date: 2018-03-30
GEER TECH CO LTD
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  • Claims
  • Application Information

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Problems solved by technology

[0002] In the past, the magnetometer calibration was a plane calibration method or a figure-of-eight calibration method to eliminate the soft magnetic effect and hard magnetic effect in the environment, but the above calibration method is only an environmental calibration method. It needs to be recalibrated, and the accuracy of the calibration is based on the premise that the output data of the magnetometer is accurate, so is the output data of the magnetometer accurate? It's impossible to judge

Method used

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  • Magnetometer calibration method and device
  • Magnetometer calibration method and device
  • Magnetometer calibration method and device

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Embodiment Construction

[0043] The inventor thought of a magnetometer calibration method, which is to put the magnetometer to be calibrated into a one-dimensional magnetic field with a constant magnetic field intensity, and make the positive and negative directions of each of the three axes of the magnetometer parallel to the one-dimensional magnetic field respectively. The magnetic field is placed in the direction of the magnetic field line; the corresponding output value of the magnetometer in each placement direction is obtained; according to the corresponding output value of the magnetometer in each placement direction and the magnetic field strength value of the one-dimensional magnetic field, Calculating the calibration parameters of the magnetometer to complete the calibration of the magnetometer. The magnetometer calibration scheme of the present invention realizes stable environment, comprehensive calibration standard parameters and accurate calibration effect, can eliminate the instrument er...

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Abstract

The invention discloses a magnetometer calibration method. The method comprises the steps of placing a magnetometer to be calibrated in a one-dimensional magnetic field with the magnetic field strength being constant, and respectively enabling positive and negative directions of each of the three axes of the magnetometer to be placed in a mode of being parallel to a magnetic induction line direction of the one-dimensional magnetic field; acquiring an output value corresponding to each placement direction of the magnetometer; and calculating a calibration parameter of the magnetometer accordingto the output value corresponding to each placement direction of the magnetometer and a magnetic field strength value of the two-dimensional magnetic field so as to complete calibration for the magnetometer. The magnetometer chip-level calibration scheme disclosed by the invention is stable in implementation environment, comprehensive in calibrated standard parameter and accurate in calibration effect, can eliminate an instrument error of the magnetometer and achieves chip-level calibration for the magnetometer.

Description

technical field [0001] The invention relates to the field of magnetic force calibration, in particular to a magnetometer calibration method and device. Background technique [0002] In the past, the magnetometer calibration was a plane calibration method or a figure-of-eight calibration method to eliminate the soft magnetic effect and hard magnetic effect in the environment, but the above calibration method is only an environmental calibration method. It needs to be recalibrated, and the accuracy of the calibration is based on the premise that the output data of the magnetometer is accurate, so is the output data of the magnetometer accurate? This is impossible to judge. Contents of the invention [0003] In view of the above problems, the present invention is proposed to provide a magnetometer calibration method and device that overcome the above problems or at least partially solve the above problems. [0004] According to one aspect of the present invention, a magneto...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCG01R33/0035
Inventor 单体江陈维亮
Owner GEER TECH CO LTD
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