Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Spectral curve reconstruction method, device and system

A spectral curve and reconstruction system technology, applied in the field of devices and systems, and spectral reconstruction methods, can solve problems such as insufficient accuracy of spectral reconstruction results, inability to cover sampling points, undersampling, etc., to achieve high-efficiency detection and avoid fences Effect, the effect of improving the accuracy of sampling reconstruction

Active Publication Date: 2021-04-27
BEIJING LUSTER LIGHTTECH
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the limitation of the number of sampling points, it leads to undersampling relative to the sampling accuracy requirements
Undersampling will lead to the fence effect when reconstructing the curve. The fence effect is that the surrounding area of ​​the sampling point cannot be covered, and the area that cannot be covered is the observation blind area
As a result, the accuracy of the spectral reconstruction results is insufficient

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spectral curve reconstruction method, device and system
  • Spectral curve reconstruction method, device and system
  • Spectral curve reconstruction method, device and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044]In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0045] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0046] Specific embodiments of the present application provide a spectral curve reconstruction method, device, and system. In this system, by changing the transmission response fun...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A spectral curve reconstruction method, device and system. Obtain the sampling result of the first sampling point of the object under test, the sampling result of the first sampling point includes the sampling results of the M channels of the sampling point; according to the light source output spectral function and the spectral response of the M sampling channels of the sampling device The product of the function determines M sampling functions, and the M sampling functions include overlapping areas; the sampling array matrix is ​​determined according to the impact function and the sampling function, and the impact function group includes multiple unit impact functions; the undershoot is determined by the sampling array matrix and the sampling result A system of definite equations, any solution of the system of underdetermined equations is the spectral function of the first sampling point. In this application, by changing the transfer response function of the light source or the camera, overlapping areas exist between sampling points with different output spectral functions and sampling functions formed by the spectral response function. Avoid the fence effect caused by undersampling and improve sampling accuracy.

Description

technical field [0001] The present application relates to the technical field of detection through spectral curves, in particular to a spectral reconstruction method, device and system. Background technique [0002] At present, the requirements for color quality control of printed matter are constantly increasing. This puts forward higher requirements for the corresponding color detection means. It is necessary to achieve high-precision real-time measurement of the spectral reflectance function of the printed matter surface. With the improvement of printing quality requirements for printed matter, the requirements for color quality control of printed matter are also continuously increased. This puts forward higher requirements for the corresponding color detection means. Especially for online color detection of printed matter, not only requires accurate measurement of printed color, but also requires extremely high detection speed. The essence of high-precision color det...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/16G06F17/12
CPCG06F17/12G06F17/16
Inventor 朱炫霖姚毅赵严
Owner BEIJING LUSTER LIGHTTECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com