An ocxo pressure-sensitive compensation circuit and a method for improving ocxo frequency pressure-sensitive characteristics

Abstract

An OCXO pressure-sensitive compensation circuit and a method for improving OCXO frequency pressure-sensitive characteristics, method steps (1) test the pressure-sensitive characteristics of OCXO products through a vacuum test, record the frequency values ​​​​under different air pressures, and calculate the maximum frequency under normal pressure and vacuum Change value Δf max , calculate the normalized frequency change value dy; (2) According to the experimental test in step (1), when the vacuum frequency is less than the normal pressure frequency, construct a capacitive or resistive compensation circuit; otherwise, construct a resistive compensation circuit; (3) According to the normalized frequency change value dy calculated in step (1), combined with the form of the specific compensation circuit constructed in step (2), calculate the capacitance C in the oscillating circuit of the OCXO product t11 or capacitor C t21 (4) According to the equivalent control capacitance calculated in step (3), the corresponding capacitance C in the compensation circuit constructed in step (2) t11 or capacitor C t21 Processing is performed to make its capacitance value correspond to the equivalent control capacitance value.

Description

technical field [0001] The invention belongs to the technical field of OCXO (highly stable crystal oscillator), and particularly relates to a method for improving the pressure-sensitive characteristic of an output frequency of an OCXO product in a pressure change environment. In this method, a compensation circuit is added to the OCXO circuit. When the environmental pressure of the OCXO product changes, the pressure sensor obtains the pressure information and converts it into electrical parameters, and the control circuit adjusts the load capacitance according to the characteristics of the product to compensate for frequency changes. the goal of. Background technique [0002] The output frequency of OCXO products will change with the change of external environmental pressure during use, mainly because the crystal itself is a pressure-sensitive device, OCXO products will experience an offset of the output frequency during this environmental change process, and the offset is ±...

AI Technical Summary

Problems solved by technology

[0003] At present, there is basically no treatment for the change of OCXO frequency with pressure, and there is no public report. Generally, when the OCXO is applied to the change of pressure environment, the change of frequency is tested in advance through normal pressure and vacuum tests, and the change is reserved during normal pressure debugging. It is more cumbersome to change the system parameters during the system joint test

Images