Secondary scattering characteristic simulation method of SAR image
A technology of secondary scattering and simulation method, which is applied in the field of satellite remote sensing applications, and can solve the problems such as the inability to effectively and accurately characterize the secondary scattering characteristics and the complex secondary scattering process.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] A method for simulating secondary scattering characteristics of a SAR image in the present invention uses a ray tracing algorithm to simulate the interaction process between the electromagnetic wave signal emitted by the SAR antenna and the building target, and uses the simulated echo signal to generate a secondary scattering characteristic image. The process is as follows figure 1 As shown in Fig. 1, the 3D imaging scene is first constructed using the 3D model of the building target, and different microwave scattering properties are assigned to each triangular element in the 3D imaging scene, and then the interaction between the electromagnetic wave and the building target is simulated using the ray tracing algorithm The process generates simulated echo signals, and finally maps the formed simulated echo signals to the SAR image plane to generate secondary scattering characteristic images.
[0036] by Figure 6 A three-dimensional model of a building in China is used ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com