Self-adaptive frequent itemset excavation method-based defect affinity analysis method and device

An analysis method and analysis device technology, applied in the field of defect affinity analysis based on adaptive frequent set mining method, can solve problems such as unsynchronized unified threshold and dynamic data scale, slow analysis of static data, etc., to improve accuracy and solve Effect of Lazy, Elaborate Evaluation Results

Active Publication Date: 2018-01-16
TSINGHUA UNIV +1
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] For this reason, an object of the present invention is to propose a kind of defect affinity analysis method based on self-adaptive frequent set mining method, this method can effectively so

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-adaptive frequent itemset excavation method-based defect affinity analysis method and device
  • Self-adaptive frequent itemset excavation method-based defect affinity analysis method and device
  • Self-adaptive frequent itemset excavation method-based defect affinity analysis method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0034] The following describes the defect affinity analysis method and device based on the adaptive frequent set mining method according to the embodiments of the present invention with reference to the accompanying drawings. Defect affinity analysis method.

[0035] figure 1 It is a flowchart of a defect affinity analysis method based on an adaptive frequent set mining method according to an embodiment of the present invention.

[0036] like figure 1 As shown, the defect affinity analysis method based on the adaptive frequent...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a self-adaptive frequent itemset excavation method-based defect affinity analysis method and device. The method comprises the following steps: a data set for preset coding is obtained, and a total input data set is obtained; a frequent itemset of a first layer is generated; a frequent itemset is searched from a candidate set of each layer, and a corresponding support degreeis saved; a superset of an itemset of a corresponding layer is searched, and a candidate itemset of a next layer is generated; a scanning function is called to check whether the candidate itemset ofthe next layer has a frequent itemset, the candidate itemset of the next layer is built, the frequent itemset of each layer is stored in a knowledge database, and a key link relation is built via an equipment ID and a voltage transformer main diagnosis and evaluation system. Via the method, problems of a conventional method which is slow in static state data analysis and desynchrony between a uniform threshold value and a dynamic data scale can be effective solved via a self-adaptive threshold value algorithm; wide area data support-based voltage transformer defect affinity analysis can be realized, and precision of excavation results can be improved.

Description

technical field [0001] The invention relates to the technical field of intelligent state evaluation of electrical equipment, in particular to a defect affinity analysis method and device based on an adaptive frequent set mining method. Background technique [0002] With the continuous development of social economy, the market demand for power supply load and power supply stability is increasing. On the one hand, the scale of the power grid expands rapidly with the increase in electricity demand. From the perspective of expansion benefits, power transformers are one of the most expensive electrical equipment, and improving their availability during their service period is conducive to reducing the operating costs of the power grid; on the other hand On the one hand, as the core equipment of the power transmission and transformation system, the reliability of the power transformer directly affects the stability of the power system. Therefore, establishing an accurate evaluati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06Q10/06
Inventor 张紫薇高文胜吐松江·卡日莫文雄王劲王红斌栾乐崔屹平
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap