Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Uniformity debugging method and device, equipment and computer-readable storage medium

A debugging method and uniformity technology, applied in the direction of calculation, digital output to display equipment, instruments, etc., can solve the problems of inconvenient operation, inability to realize automatic debugging of the uniformity debugging scheme, cumbersome operation, etc., to simplify calculation and reduce the amount of calculation , the effect of optimizing efficiency

Inactive Publication Date: 2020-12-01
BOE TECH GRP CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The uniformity debugging scheme of the traditional splicing display device cannot realize automatic debugging, and manual debugging is required. Due to the large number of splicing pieces and light-emitting components in the splicing display device, the operation is very cumbersome, and with the increase of product size, more inconvenient to operate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Uniformity debugging method and device, equipment and computer-readable storage medium
  • Uniformity debugging method and device, equipment and computer-readable storage medium
  • Uniformity debugging method and device, equipment and computer-readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for ease of description, only parts related to the invention are shown in the drawings.

[0036] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0037] figure 1 It is a flow chart of a uniformity debugging method provided by an embodiment of the present invention.

[0038] Such as figure 1 As shown, in this embodiment, a uniformity debugging method provided by the present invention includes:

[0039] S15: Supply power to the splicing di...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a uniformity debugging method, device, equipment, and computer-readable storage medium. The method includes: supplying power to a splicing display device with different power supply configurations within a first voltage range, and collecting each splicing display of the splicing display device. The brightness information of the display area of ​​the component under each power supply configuration; calculate the uniformity of the spliced ​​display device under each power supply configuration according to each brightness information, and determine the power supply configuration with the maximum uniformity. The uniformity debugging method and device, equipment, and computer-readable storage medium provided by the present invention obtain corresponding brightness information by automatically traversing different power supply configurations that meet the brightness requirements, and calculate each uniformity according to each brightness information, and finally determine the maximum uniformity The power supply configuration corresponding to the degree can realize automatic debugging of the uniformity of the splicing display device.

Description

technical field [0001] The present application relates to the technical field of display device debugging, in particular to a uniformity debugging method, device, equipment, and computer-readable storage medium. Background technique [0002] With the rapid development of social informatization, large-size splicing display devices bring immersive visual experience to users with their unique large-scene display effects, and are welcomed by the market. [0003] However, as the size of the spliced ​​display device increases, the uneven brightness of the spliced ​​display areas gradually becomes more prominent, thereby affecting the visual effect. For this problem, it is necessary to maximize the uniformity of the spliced ​​display device, so as to present the best visual effect. [0004] The uniformity debugging scheme of the traditional splicing display device cannot realize automatic debugging, and manual debugging is required. Due to the large number of splicing pieces and l...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/14
CPCG06F3/1446G09G3/2096G09G3/32G09G2300/026G09G2320/0233G09G2330/02G09G2300/0842
Inventor 杨凡冯朋朋王鑫
Owner BOE TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com