Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-station single-parameter intelligent concurrent testing device and method for electrical characteristic parameters of LED light source products

A technology of LED light source and test method, which is applied in the direction of single semiconductor device test, etc., can solve the problem of unsuitable LED test task scheduling, etc., and achieve the effect of saving detection time and improving detection efficiency

Active Publication Date: 2019-09-06
SOUTH CHINA UNIV OF TECH
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The scheduling model proposed in this article is suitable for multi-machine and multi-process job scheduling, but the establishment of the scheduling model, objective function, and constraint conditions for LED testing with a single machine and multiple processes is obviously different from the method in this article, so it is not suitable for LED testing. task scheduling

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-station single-parameter intelligent concurrent testing device and method for electrical characteristic parameters of LED light source products
  • Multi-station single-parameter intelligent concurrent testing device and method for electrical characteristic parameters of LED light source products
  • Multi-station single-parameter intelligent concurrent testing device and method for electrical characteristic parameters of LED light source products

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the embodiments and accompanying drawings.

[0028] figure 1 It is a multi-station single-parameter intelligent concurrent test device structure for the electrical characteristic parameters of LED light source products, including: a host computer 101, an electrical parameter measurement module 104, a station switching controller module 103, and a power supply module 102;

[0029] The upper computer communicates with and controls the electrical parameter measurement module, the station switching controller module and the power supply module respectively;

[0030] The electrical parameter measurement module measures the electrical parameters of the LED in real time, and transmits the electrical parameters to the host computer for processing, storage and analysis;

[0031] The station switching...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-station single-parameter intelligent concurrent test device and method of electrical characteristic parameters of LED light source products. The device comprises a host, an electrical parameter measurement module, a station switch controller module and a power supply module. The host communicates with and controls the electrical parameter measurement module, the station switch controller module and the power supply module. The electrical parameter measurement module measures electrical parameters of an LED in real time and uploads the electrical parameters to the host for processing, storage and analysis. The station switch controller module is connected with a to-be-measured multi-station LED and carries out circuit switching on the accessed multi-station LED so as to connect the to-be-measured LED with the power supply module and the electrical parameter measurement module in different time. The power supply module outputs different current or voltage according to test demands. According to the invention, under the premise of ensuring that the test of the electrical characteristic parameters of LED light source products is performed according to the standard completely, scheduling is performed through an intelligent algorithm, so the multi-station concurrent test is achieved, detection time is greatly saved and detection efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of electrical characteristic parameter testing, and in particular relates to a multi-station single-parameter intelligent concurrent testing device and a testing method thereof for electrical characteristic parameters of LED light source products. Background technique [0002] LED light source products are one of the most basic components in lighting products, and their quality largely determines the quality of lighting products, so it is very important to quickly and accurately test their electrical characteristic parameters. Electrical characteristic parameter test is the main test item of LED light source product quality inspection, including rated voltage test, rated current test, rated power test, maximum limit power test, maximum allowable operating current test, maximum allowable reverse voltage test, maximum allowable pulse height test. The test process of each electrical characteristic parameter te...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 刘桂雄陈伟标黄坚
Owner SOUTH CHINA UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products