Multi-station single-parameter intelligent concurrent testing device and method for electrical characteristic parameters of LED light source products
A technology of LED light source and test method, which is applied in the direction of single semiconductor device test, etc., can solve the problem of unsuitable LED test task scheduling, etc., and achieve the effect of saving detection time and improving detection efficiency
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[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the embodiments and accompanying drawings.
[0028] figure 1 It is a multi-station single-parameter intelligent concurrent test device structure for the electrical characteristic parameters of LED light source products, including: a host computer 101, an electrical parameter measurement module 104, a station switching controller module 103, and a power supply module 102;
[0029] The upper computer communicates with and controls the electrical parameter measurement module, the station switching controller module and the power supply module respectively;
[0030] The electrical parameter measurement module measures the electrical parameters of the LED in real time, and transmits the electrical parameters to the host computer for processing, storage and analysis;
[0031] The station switching...
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