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A Method for Detection of Dark and Weak Spots in Infrared Images

A target detection and infrared image technology, applied in the field of infrared detection, can solve the problems of large missed detection probability and limited number of candidate targets, achieving the effects of low complexity, easy real-time implementation and low false alarm rate

Inactive Publication Date: 2019-07-19
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Application Information

AI Technical Summary

Problems solved by technology

The traditional top-hat algorithm only uses one structural element, ignoring the differences in point target details in different directions, so the number of candidate targets detected by it is limited, which may result in a greater probability of missed detection

Method used

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  • A Method for Detection of Dark and Weak Spots in Infrared Images
  • A Method for Detection of Dark and Weak Spots in Infrared Images
  • A Method for Detection of Dark and Weak Spots in Infrared Images

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Embodiment

[0099] The present invention uses a self-built equipment to collect an infrared dark and weak point target image sequence. The five images in the sequence are shown in image 3 . The image contains a large number of complex cloud backgrounds, and there are many fixed noises or random noises in the background. These noises seriously interfere with the detection of small targets and easily cause a large false alarm rate.

[0100] The present invention first adopts the combined operation of Top-hat and Bottom-hat transformation, that is, the original image plus the top hat transformation result and subtracting the bottom hat transformation result. Here, the designed structural elements in 8 directions are used to extract all the elements in the image. The points of interest that may be distributed are the target regions of interest, and then these extracted regions of interest are combined. Next, apply adaptive threshold to the above-mentioned processing result image and use constan...

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Abstract

The invention discloses a method for detecting weak spot targets in an infrared image, which adopts structural elements of 5×5 dimensions in 8 directions to extract all possible targets of different scales; obtains the target region of interest through adaptive threshold processing, and effectively improves the target Signal-to-noise ratio; use the judgment criterion of background edge points and point targets in the local neighborhood to remove the residual background edge points; remove noise points and obtain the target motion trajectory according to the matching relationship between frames; the algorithm complexity is not high and meets real-time The results show that the target detection probability of the present invention is high, and the false alarm rate is low at the same time, which has important application value.

Description

Technical field [0001] The invention belongs to the technical field of infrared detection, and specifically relates to a method for detecting dark and weak point targets in an infrared image, and is suitable for detecting dark and weak point targets in an infrared image with a signal-to-noise ratio of about 2 to 3 in a complex background. Background technique [0002] Infrared dark and weak target detection technology is of great significance to the development of infrared search systems, precision guidance and other fields. The operating distance is an important indicator to measure the infrared search and tracking system. The image size of a long-distance low-signal-to-noise ratio point target varies between 1×1~3×3 pixels during movement, and its shape information varies with distance and imaging. The difference in angle is constantly changing. In fact, the image of a point target on the detector occupies less of a pixel, and more often it will spread into 2 pixels in the hor...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T3/40G06T7/13G06T7/20G06K9/32
CPCG06T3/4038G06T7/13G06T7/20G06T2207/10048G06V10/25G06V2201/07
Inventor 王德江刘让贾平车鑫
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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