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Automatic mica plate sorting device

A sorting device and automatic sorting technology, applied in the direction of measuring devices, electrical devices, electromagnetic measuring devices, etc., can solve the problems of low measurement accuracy, poor measurement repeatability, and low production efficiency, and achieve high sorting accuracy, Effects of improving measurement stability and improving measurement accuracy

Inactive Publication Date: 2017-09-15
SICHUAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the prior art, sorting is achieved by measuring one by one with measuring instruments, which has the problems of low production efficiency, low measurement accuracy and poor measurement repeatability

Method used

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  • Automatic mica plate sorting device
  • Automatic mica plate sorting device
  • Automatic mica plate sorting device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] Embodiment 1 provides a kind of mica sheet automatic sorting device, such as figure 1 As shown, it includes a base 100 and a control unit, and the base is provided with a feeding mechanism 200, a sheet feeding mechanism 300, a measuring mechanism 400 and a material receiving mechanism 500;

[0038] The control unit controls the sheet taking and feeding mechanism 300 to take out the mica sheet from the feeding mechanism 200;

[0039] The control unit controls the sheet taking and feeding mechanism 300 and the measuring mechanism 400 to measure the thickness of the mica sheet;

[0040] The control unit controls the sheet fetching and feeding mechanism 300 and the material receiving structure 500 to complete mica sheet sorting.

[0041] figure 1 Only the mechanical structural features of the sorting device are described, and the control unit is not shown. The control unit is signal-connected to the controlled components in the taking-up and feeding mechanism 300, the me...

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Abstract

The invention relates to mica plate sorting, in particular to an automatic mica plate sorting device. The automatic mica plate sorting device comprises a base and further comprises a control unit; a feeding mechanism, a plate taking and conveying mechanism, a measuring mechanism and a material receiving mechanism are arranged on the base, the control unit controls the plate taking and conveying mechanism to take a mica plate from the feeding mechanism, the control unit controls the plate taking and conveying mechanism and the measuring mechanism to measure the thickness of a mica plates, and the control unit controls the plate taking and feeding conveying mechanism and the material receiving mechanism to finish mica plate sorting. According to the automatic mica plate sorting device, the feeding mechanism, the plate taking and conveying mechanism, the measuring mechanism and the material receiving mechanism are controlled through the control center to achieve automatic sorting of the mica plates, automatic measuring and automatic sorting are finished, measuring repetition is good, sorting precision is high, and the sorting interval can be flexibly arranged according to actual needs. Design of four layers of circuit boards is adopted in the control unit, the system stability is improved, a 32 ARM CPU is adopted, and the system processing speed is improved.

Description

technical field [0001] The invention relates to sorting mica flakes, in particular to an automatic mica flake sorting device. Background technique [0002] Mica sheets are widely used as insulating materials in electrical products, and the thickness of mica sheets is an important parameter in the application process. The thickness of the mica flakes used in production practice is between 20 μm and 40 μm. It is often necessary to sort them according to the thickness of the mica flakes, and distinguish the usable mica flakes that meet the thickness requirements from the unusable mica flakes that do not meet the thickness requirements. The measurement accuracy is required to reach 1 μm. In the prior art, sorting is achieved by measuring one by one with measuring instruments, which has the problems of low production efficiency, low measurement accuracy and poor measurement repeatability. Contents of the invention [0003] The object of the present invention is to overcome th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/34B07C5/02B07C5/36B07C5/38G01B7/06
CPCB07C5/34B07C5/02B07C5/361B07C5/362B07C5/38G01B7/10
Inventor 周新志宁芊赵成萍
Owner SICHUAN UNIV
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