Measurement method and measurement device
A measurement method and technology of a measurement device, applied in the field of high-precision frequency measurement, can solve the problems of measurement error, increased burden of measurement work, etc.
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Embodiment 1
[0029] This embodiment relates to a measuring device, according to figure 1 As shown, including external reference source, measurement instrument group, compensation detection source and central processing unit. Wherein, the external reference source is a high-stability atomic clock, which can be an H clock, a Cs clock, etc., or a GPS timing signal, which is used as an external clock reference for the measuring instrument group. The specific structures and functions of the measuring instrument group and the compensation detection source are all existing technologies, and will not be repeated here.
[0030] The compensation detection source is suitable for outputting a compensation detection signal whose stability index is not lower than the stability index of the signal output by the measured frequency source to the measuring instrument group.
[0031] The measuring instrument group is adapted to receive the measured signal and the compensated detection signal output by the f...
Embodiment 2
[0046] This embodiment is a measurement method proposed on the basis of the hardware of the device in the first embodiment, including the following steps,
[0047] The measuring instrument group simultaneously measures the compensation signal output by the compensation detection source and the measured signal output by the measured frequency source under the clock reference of the external reference source, and outputs the measurement results to the central processing unit;
[0048] When there is a jump point in the measurement result, the central processing unit performs the following analysis on the data of the measurement result:
[0049] i. When the test results of the measured frequency source and the compensation detection source jump at the same time, it is judged that there is a problem with the measuring instrument group or the external reference source, and the test information is output;
[0050] ii. When the measurement result of the frequency source under test has...
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Abstract
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Application Information
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