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Asynchronous successive approximation analog-to-digital conversion circuit

一种模数转换电路、异步逐次逼近的技术,应用在电子领域,能够解决影响有效位数等性能等问题

Active Publication Date: 2017-08-11
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the metastability problem of the comparison circuit will limit the application of asynchronous successive approximation ADC, which will affect its effective number of digits and other performance

Method used

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Examples

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Embodiment Construction

[0042] As mentioned in the background art section, the metastability problem of the comparison circuit exists in the asynchronous successive approximation analog-to-digital conversion circuit in the prior art.

[0043] The inventor of the present application analyzed the prior art. In the prior art, the comparison circuit generally has the problem of metastable state, such as figure 2 As shown in the schematic diagram of the relationship between the time required for the comparison circuit and the input voltage difference, when the voltage difference between the two input terminals of the comparison circuit is very small (point A), the comparison circuit needs more time to compare the correct result; when the comparison circuit When the voltage difference at the input terminals of the device is large (point B), the time required will be stabilized at a minimum device delay time.

[0044] image 3 Yes figure 1 A schematic diagram of the relationship between the internal sta...

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PUM

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Abstract

The invention provides an asynchronous successive approximation analog-to-digital conversion circuit comprising a sample hold circuit, an analog-to-digital conversion circuit, a first voltage comparing circuit, a first logic circuit and a pulse generating circuit, wherein the first voltage comparing circuit compares input signals in response to an effective level of a latch signal, and outputs a first logic level and a second logic level; the first logic circuit identifies a comparison result of the first voltage comparing circuit according to the first logic level and the second logic level in response of the effective level of an identification signal; the pulse generating circuit generates the latch signal and the identification signal, wherein the generation moments of the effective levels of the latch signal and the identification signal are independent from the first logic level and the second logic level. The asynchronous successive approximation analog-to-digital conversion circuit can eliminate the problem that the comparing circuit is incomplete caused by the metastable state problem of the comparing circuit, guarantee the precision of the asynchronous successive approximation analog-to-digital conversion circuit, and is easy to implement and low in cost.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to an asynchronous successive approximation analog-to-digital conversion circuit. Background technique [0002] Among direct analog-to-digital converters (ADC, Analog-to-Digital Converter), successive approximation analog-to-digital converters (SAR ADC, Successive Approximation Register Analog-to-Digital Converter) are more commonly used. Its conversion process is similar to weighing objects with a balance, and SARADC compares the input analog signal with different reference voltages multiple times, so that the converted digital quantity is numerically close to the input analog quantity successively. The reference voltage is usually Generated by a digital-to-analog converter (DAC, Digital-to-Analog Converter). Successive approximation analog-to-digital converters include synchronous and asynchronous, wherein a synchronous successive approximation analog-to-digital converter (SS...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/38
CPCH03M1/38H03M1/46H03M1/125H03M1/44H03M1/42
Inventor 荀本鹏刘飞郭萌萌唐华杨海峰
Owner SEMICON MFG INT (SHANGHAI) CORP
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