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Image defective pixel detection method and apparatus

A detection method and technology for dead pixels, applied in the field of image processing, can solve problems such as the inability to meet the needs of large-resolution sensors and the low detection rate of dead pixels.

Active Publication Date: 2017-08-04
FUZHOU ROCKCHIP SEMICON
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Problems solved by technology

[0003] To this end, it is necessary to provide a technical solution for image dead point detection to solve the problems of existing dead point detection algorithms such as chip area consumption, low detection rate of dead points, and inability to meet the needs of large-resolution sensors.

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  • Image defective pixel detection method and apparatus
  • Image defective pixel detection method and apparatus
  • Image defective pixel detection method and apparatus

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Embodiment Construction

[0148] In order to explain in detail the technical content, structural features, achieved goals and effects of the technical solution, the following will be described in detail in conjunction with specific embodiments and accompanying drawings.

[0149] see figure 1 , is a schematic diagram of a Bayer format image involved in an embodiment of the present invention. The image to be detected in the present invention is a bayer format image, and the pixel channels of the pixels include the Gr channel, the Gb channel, the B channel and the R channel, and the corresponding pixel value of each pixel is the Gr channel component value and the Gb channel component value , R channel component value, and B channel component value. from figure 1 It can be seen from the figure that the Bayer format images are arranged according to certain rules. Specifically, the 2x2 window is copied and repeatedly arranged. Each 2x2 window includes 4 pixels, and the channel component values ​​​​of 4 pix...

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Abstract

The invention discloses an image defective pixel detection method and apparatus. The method includes: defective pixel detection of an image with the bayer format is performed; a first gradient value, a second gradient value, and a third gradient value are calculated according to the position of a current pixel point and the corresponding relations between the current pixel point and surrounding pixel points; and whether the current pixel point is a suspected defective pixel is determined through comparison of the relations of the three gradient values. The defective pixels are searched based on the attribute of the defective pixels of the image, compared with the conventional defective pixel detection method, the hardware area is reduced, the pixel points of the image are checked one by one, more suspected defective pixels can be discovered, the suspected defective pixels are checked, and the efficiency of defective pixel detection is effectively improved.

Description

technical field [0001] The invention relates to the field of image processing, in particular to a method and device for detecting dead pixels in an image. Background technique [0002] With the advancement of science and technology, the resolution of existing camera sensors continues to increase. The previous dead point detection algorithms are mainly aimed at the detection of dead pixels of sensors with small and medium resolutions. For sensors with high resolutions, many algorithms have slow detection speeds and cannot achieve online detection. At the same time, the existing dead point detection method (such as the method based on LUT) needs to occupy MEM and consume chip area. With the continuous improvement of ISP input resolution, its area consumption will increase by dozens of times. At the same time, with the improvement of living standards, people have higher requirements for image quality. The user's eyes are very sensitive to the bright or dark spots on a picture,...

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Application Information

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IPC IPC(8): G06T7/00G06T7/41G06T7/90
CPCG06T7/0008G06T2207/10024G06T2207/30121
Inventor 朱祖建武继瑞郑天翼罗宁戴正展
Owner FUZHOU ROCKCHIP SEMICON
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