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Image defective pixel detection method and apparatus

A detection method and detection device technology, applied in image analysis, image data processing, instruments, etc., can solve the problems of unable to meet the needs of large-resolution sensors and low detection rate of dead pixels

Active Publication Date: 2017-08-04
FUZHOU ROCKCHIP SEMICON
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Problems solved by technology

[0003] To this end, it is necessary to provide a technical solution for image dead point detection to solve the problems of existing dead point detection algorithms such as chip area consumption, low detection rate of dead points, and inability to meet the needs of large-resolution sensors.

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  • Image defective pixel detection method and apparatus
  • Image defective pixel detection method and apparatus
  • Image defective pixel detection method and apparatus

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Embodiment Construction

[0110]In order to explain in detail the technical content, structural features, achieved goals and effects of the technical solution, the following will be described in detail in conjunction with specific embodiments and accompanying drawings.

[0111] see figure 1 , is a schematic diagram of a Bayer format image involved in an embodiment of the present invention. The image to be detected in the present invention is a bayer format image, and the pixel channels of the pixels include the Gr channel, the Gb channel, the B channel and the R channel, and the corresponding pixel value of each pixel is the Gr channel component value and the Gb channel component value , R channel component value, and B channel component value. From figure 1 It can be seen from the figure that the Bayer format images are arranged according to certain rules. Specifically, the 2x2 window is copied and repeatedly arranged. Each 2x2 window includes 4 pixels, and the channel component values ​​​​of 4 pixe...

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Abstract

The invention discloses an image defective pixel detection method and apparatus. The method includes: obtaining an N*M pixel block of an image, arranging all pixel points in the pixel block in sequence to obtain a pixel value sequence, calculating a median of the pixel value sequence, and obtaining a pixel median; determining a specified small pixel value and a specified large pixel value from the pixel value sequence, calculating a first difference, and determining the pixel type of a current pixel point and calculating a second difference according to the relation between the current pixel point and the pixel median; and determining whether the current pixel point is a suspected defective pixel by determining whether the quotient of the second difference and the first difference is greater than a first preset error. The defective pixel is checked based on the attribute of the defective pixel of the image, compared with the conventional defective pixel detection method, the hardware area is reduced, pixel points of the image are checked one by one, more suspected defective pixels can be discovered, and the detection efficiency of the defective pixels is improved.

Description

technical field [0001] The invention relates to the field of computer technology security, in particular to a method and device for detecting bad image pixels. Background technique [0002] With the advancement of science and technology, the resolution of existing camera sensors continues to increase. The previous dead point detection algorithms are mainly aimed at the detection of dead pixels of sensors with small and medium resolutions. For sensors with high resolutions, many algorithms have slow detection speeds and cannot achieve online detection. At the same time, the existing dead point detection method (such as the method based on LUT) needs to occupy MEM and consume chip area. With the continuous improvement of ISP input resolution, its area consumption will increase by dozens of times. At the same time, with the improvement of living standards, people have higher requirements for image quality. The user's eyes are very sensitive to the bright or dark spots on a pic...

Claims

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Application Information

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IPC IPC(8): G06T7/00
Inventor 罗宁朱祖建武继瑞戴正展郑天翼
Owner FUZHOU ROCKCHIP SEMICON
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