A method for measuring local surface resistance of polluted insulators
A technology of surface resistance and measurement method, applied in the direction of measurement device, measurement of electrical variables, measurement of resistance/reactance/impedance, etc., can solve problems such as affecting measurement accuracy, and achieve the effect of eliminating contact resistance, reliable and real pollution, and simple operation.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0039] The sticking area of the aluminum foil tapes 1, 2, 3, 4 on the polluted insulator 5 to be tested is an arc edge with the same radius from the center of the polluted insulator 5 to be tested.
Embodiment 2
[0041] The sticking area of the aluminum foil tapes 1, 2, 3, 4 on the polluted insulator 5 to be tested is a diameter at the center of the polluted insulator 5 to be tested.
[0042] In the above two embodiments, the partial division methods of the aluminum foil tapes 1, 2, 3, and 4 to the polluted insulator under test can ensure the stability of the current flow when the overall pressure is applied to the polluted insulator under test.
[0043] In the above-mentioned embodiment 1, when a voltage is applied to the polluted insulator 5 as a whole, the two ends of the applied voltage should preferably be the same arc edges pasted on the insulator 5 by the aluminum foil tape 1, 2, 3, and 4, so as to ensure the continuity of the current. shortest path.
[0044] In the above-mentioned embodiment 2, when a voltage is applied to the measured dirty insulator 5 as a whole, the two ends of the applied voltage should preferably be the two ends of the same diameter pasted on the tested in...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com