Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ray detection substrate, manufacturing method therefor, and ray detection device

A technology for detecting substrates and rays, applied in the display field, can solve problems such as poor performance of X-ray detection devices, and achieve good performance

Active Publication Date: 2017-06-30
BOE TECH GRP CO LTD
View PDF7 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem of poor performance of the X-ray detection device, an embodiment of the present invention provides a radiation detection substrate, a manufacturing method thereof, and a radiation detection device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ray detection substrate, manufacturing method therefor, and ray detection device
  • Ray detection substrate, manufacturing method therefor, and ray detection device
  • Ray detection substrate, manufacturing method therefor, and ray detection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0070] In order to make the purpose, technical solution and advantages of the present application clearer, the implementation manners of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0071] figure 1 A structural schematic diagram of a radiation detection substrate provided for an embodiment of the present invention, as shown in figure 1 As shown, the radiation detection substrate may include: a base substrate 1, a photodiode is arranged on the base substrate 1, the photodiode includes two doped layers and an intrinsic layer 02, and the intrinsic layer 02 is located between the two doped layers Between, the arrangement direction of the two doped layers is parallel to the base substrate 1 .

[0072] Wherein, the two doped layers include a first doped layer 011 and a second doped layer 012, and the number of free electrons in the first doped layer 011 is smaller than the number of holes (that is, the first dope...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a ray detection substrate, a manufacturing method therefor, and a ray detection device, and belongs to the technical field of display. The ray detection substrate comprises a substrate, and the substrate is provided with a photodiode. The photodiode comprises two doping layers and an intrinsic layer, wherein the intrinsic layer is located between the two doping layers, and the arrangement direction of the two doping layers is parallel to the substrate. According to the invention, the substrate solves a problem that the performance of an X-ray detection device is poorer, improves the performance of the X-ray detection device, and is used for the ray detection device.

Description

technical field [0001] The present application relates to the field of display technology, in particular to a radiation detection substrate, a manufacturing method thereof, and a radiation detection device. Background technique [0002] X-ray (also known as Roentgen ray) detection device can detect the internal shape and structure of the parts to be tested. The X-ray detection device includes: an X-ray source, an indirect X-ray detection substrate and a display. When using an X-ray detection device, the parts to be inspected can be placed between the X-ray source and the X-ray detection substrate, the X-ray source can emit X-rays, and the X-rays enter the X-ray detection substrate after passing through the parts to be inspected. The indirect X-ray detection substrate can generate electrical signals according to incident X-rays, and input the generated electrical signals to a display, so that the display displays images. [0003] In the related art, the indirect X-ray detec...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/115H01L31/0352H01L31/18
CPCH01L31/035272H01L31/115H01L31/1804G01T1/2018H01L31/02019H01L31/02325H01L31/1055G01T1/24H01L27/14663H01L31/022408H01L27/14612H01L27/14689H01L31/03762H01L31/1864H01L27/14698
Inventor 赵磊
Owner BOE TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com