Nondestructive screening method for radiation-proof ability of low-dropout regulator and device

Abstract

The invention provides a nondestructive screening method for radiation-proof ability of low-dropout regulator and a device. The method comprises that the pre-irradiation output noise voltage value and the output voltage value regarded as the random subsamples of the low-dropout regulator are obtained; the post-irradiation output voltage value regarded as the random subsample of the low-dropout regulator is obtained; based on the pre-irradiation output voltage value and the post-irradiation output voltage value, the output voltage drift amount is obtained by calculation; the pre-irradiation output noise voltage value is regarded as the information parameter and the output voltage drift amount is regarded as the irradiation performance parameter to establish the multiple linear regression equation and calculate the coefficient vector of the linear regression equation; based on the coefficient vector, the nondestructive screening regression prediction equation between the information parameter and the irradiation performance parameter is established; the nondestructive screening regression prediction equation is utilized to filtrate the same batch of other low-dropout regulator. The nondestructive screening method for radiation-proof ability of low-dropout regulator has the advantages of performing test and screening of accurate and efficient radiation-proof ability of components and parts in the prerequisite of no damage to the low-dropout regulator.

Description

technical field [0001] The invention relates to the technical field of electronic appliances, in particular to a method and a device for non-destructive screening of the anti-irradiation capability of a low-dropout linear voltage stabilizer. Background technique [0002] The low dropout linear regulator is mainly composed of transistors, reference diodes, comparator amplifiers and sampling resistors. The device has the outstanding advantages of low load regulation, low quiescent current, low noise, and high efficiency, and is used for low dropout in space radiation environment. Linear regulator (LDO, Low Dropout Regulator), under the action of space charged particles and various rays, its performance will change significantly, its output ripple, linear adjustment rate, quiescent current, conversion efficiency and noise voltage power spectrum Therefore, how to test the anti-irradiation ability of the low-dropout linear regulator applied in the space environment, and then scre...

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Problems solved by technology

[0003] In the prior art, the method of testing and screening the anti-irradiation ability of low-dropout linear voltage regulators for aerospace mainly adopts the "irradiation-annealing" method. The specific process of the irradiation-annealing screening method is as follows: figure 1 As shown, the device to be screened is first irradiated with a rated dose; then one or several sensitive electrical parameters are selected, and the measurement is completed within two hours, and the unqualified devices are screened out; then 50% of the rated dose is irradiated; Then the electric test is carried out again after the pressure annealing; Finally, a suitable device is screened out; this method has the defects of high detection cost, long detection time and certain destructiveness to the device itself; The method of irradiating the environment with low dose rate in space, the simulation results are often inaccurate

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