Multiport scattering parameter test method based on four-port vector network analyzer

Abstract

The invention provides a multiport scattering parameter test method based on a four-port vector network analyzer; the method comprises the following steps: segmenting a multiport scattering parameter matrix; using the four-port vector network analyzer to measure the scattering parameter matrixes of different ports for various times, and combining the obtained matrixes; using a calibration algorithm to improve the precision of the combined matrix, thus obtaining the multiport scattering parameter. The method uses the four-port vector network analyzer to measure a multiport tested piece for many times, thus obtaining the scattering parameter matrix, reducing requirements on vector network analyzer port numbers, and reducing hardware testing cost; the calibration algorithm can remove the errors of the combined multiport scattering parameter matrix, thus improving the scattering parameter testing precision.

Description

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AI Technical Summary

Benefits of technology

This technology helps reduce costs by making it easier for different types of measurements (such as electrical conductivity) to be done with one device instead of another. It also improves the precision of measuring scattered light from specific locations within an object's surface compared to traditional methods that require many devices or complicated equipment.

Problems solved by technology

This patents describes different methods that aim at improving the quality control and productivity of radio frequency (RF)-based technology during its deployment across various industries like defense, telecommunication, transportation, medical equipment, etc., especially where there may require frequent changes between connection points due to factors like temperature variations over long distances. Current methodologies involve connecting each component separately before performing any type of measurement, resulting in slowdown times and poorer results than desired. Therefore, new ways must be developed to efficiently conduct high-quality multi-ports without requiring expensive components.

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