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Phase imaging device and method based on dark stripe logic judgment

A technology of logical judgment and imaging equipment, applied in the direction of instruments, measuring devices, scientific instruments, etc., can solve the problems of multiple measurements, sensitivity to noise, poor phase resolution, etc.

Active Publication Date: 2017-05-24
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The purpose of the present invention is to overcome the defects in the prior art such as high computational complexity, sensitivity to noise, large number of measurements, poor phase resolution, etc.

Method used

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  • Phase imaging device and method based on dark stripe logic judgment
  • Phase imaging device and method based on dark stripe logic judgment
  • Phase imaging device and method based on dark stripe logic judgment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0109] refer to figure 1 , the first embodiment of the present invention provides a phase imaging device based on dark fringe logic judgment. The phase imaging device includes: a light source device 1 , a beam expander and collimator element 2 , a spatial light modulator 3 , a lens element 4 , an array detector 5 and an image generating device (not shown in the figure).

[0110] The connection relationship and working process of each component of the temperature measuring equipment can be described as follows:

[0111] The light source device 1 emits polarized laser light toward the object to be measured 6 , and the polarized laser beam is expanded by the beam expander and collimation element 2 , so that the beam spot size is adapted to the size of the object to be measured 6 and the modulation area of ​​the spatial light modulator 3 . The polarized laser light penetrates the object to be measured 6 and arrives at the spatial light modulator 3. The spatial light modulator 3 p...

specific example

[0129] Assuming that the actual pixels of the object 6 to be tested are 16×16, its actual image is expressed in a matrix as:

[0130]

[0131] and suppose q j There are four values ​​(ie m=4), and because q j can be real and imaginary, so let’s assume that q j =i,-i,-1,1.

[0132] According to the phase value q j The number and value of the four 1×16 matrices are constructed, the pixels in the first column of the matrix are set as the reference pixel r=1, and the ratio between adjacent pixels is Right now:

[0133] f 1 =[1 -i -1 i 1 -i -1 i 1 -i -1 i 1 -i -1 i];

[0134] f 2 =[1 i -1 -i 1 i -1 -i 1 i -1 -i -1 -i 1 i];

[0135] f 3 =[1 -1 1 -1 1 -1 1 -1 1 -1 1 -1 1 -1 1 -1];

[0136] f 4 =[1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1];

[0137] in the matrix f 1 In , there is a phase ratio between pixels in two adjacent columns in the matrix f 2 In , there is a phase ratio between pixels in two adjacent columns in the matrix f 3 In , there is a phase ratio between pix...

specific example

[0151] still assume q j =i,-i,-1,1, first establish a 4×1 object reference value matrix r for the object to be measured obj ,but Expand it to a 4×4 matrix

[0152] Also set a 1×4 phase mask reference ratio matrix for the phase mask: r pattern = [-i i -1 1];

[0153] the matrix r pattern Extended to a 4×4 matrix

[0154] The above matrix R obj and matrix R pattern Dot multiplication (corresponding element multiplication) to get the dot product matrix B:

[0155]

[0156] When the element in the dot product matrix B is 1, the position is replaced with 0, when the element in the dot product matrix B is not 1, the position remains unchanged and is still recorded as 1, thus obtaining a combination of 0 and 1 Form a reference library matrix of size m×m

[0157] In particular, if r obj with r pattern When the corresponding elements are arranged in positive order, R is a matrix whose positive diagonal elements are 0 and the rest of the position elements are 1; if ...

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Abstract

The invention provides a phase imaging device based on dark stripe logic judgment; the phase imaging device includes a light source device, a beam expanding and collimating element, a spatial light modulator, a lens element, an array detector and an image generating device; the image generating device builds a reference library matrix according to a plurality of phase masks loaded by the spatial light modulator and a relative phase value of a to-be-tested object; according to a two-dimensional intensity image matrix, recorded by the array detector, of the to-be-tested object corresponding to each phase mask, a dark stripe between each adjacent pixel points in each two-dimensional intensity image matrix is judged; then the phase ratio between the adjacent pixel points is obtained through combining the reference library matrix; according to a preset standard pixel point and a planned rout, a multiplicative ratio between each pixel point and the standard pixel point is generated, and phase imaging of the to-be-tested object is constructed. The invention also provides a phase imaging method based on dark stripe logic judgment. The device and method have the advantages of low computational complexity, high phase reconstruction accuracy, global optimality and the like.

Description

technical field [0001] The invention relates to the field of phase imaging, in particular to a phase imaging device and method based on dark fringe logic judgment. Background technique [0002] In many existing optical imaging systems, optical detection devices usually convert photons into electrons, so that they can only measure the intensity of the light field, that is, the square of the Fourier transform amplitude of the signal, but cannot directly measure the intensity of the light field. phase information. This is mainly because the vibration frequency of the electromagnetic field of visible light is about 10 15 Hz, currently no electronic measurement equipment can capture the phase signal at this vibration frequency. The vibration frequency of the microwave spectrum is relatively low, and its frequency coverage ranges from hundreds of megahertz to tens of gigahertz. At present, there are mature phase measurement devices with an angular resolution of about 0.1 degrees...

Claims

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Application Information

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IPC IPC(8): G01N21/84
CPCG01N21/84
Inventor 俞文凯熊安东赵清
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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