Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Simulation verification system

A technology for simulation verification and verification module, applied in the field of simulation verification system, can solve the problems of inaccurate simulation verification results, small scope of application, low test efficiency, etc., and achieve the effect of accurate test results, large scope of application, and improved test efficiency

Active Publication Date: 2017-05-17
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF6 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, on the one hand, because the interface provided by the EDA simulation verification tool is suitable for calling C / System C or System Verilog, it cannot call higher-level languages. Therefore, when certain functions of some chips need to call higher-level When the simulation verification is carried out in the language of the prior art, the simulation verification system in the prior art cannot meet the requirements. Therefore, the simulation test system in the prior art has a small application range and low test efficiency.
[0005] On the other hand, since the operation between Verilog and the calling language in the simulation verification system in the prior art has no star distinction, the result of the simulation verification is inaccurate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Simulation verification system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The invention provides a simulation verification system, which has a wide application range during use, improves test efficiency and makes test results more accurate.

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] Please refer to figure 1 , figure 1 It is a schematic structural diagram of a simulation verification system provided by the present invention.

[0027] The s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a simulation verification system. The simulation verification system comprises a Verilog verification module, a System Verilog interface module, a System C module and a high-level language module. The Verilog verification module is used for instantiating RTL codes and obtaining first state information and further used for receiving time sequence control information returned by the System Verilog interface module to achieve simulation verification on a chip. The System Verilog interface module is used for processing the first state information to obtain second state information and further used for sending the time sequence control information returned by the System C module. The System C module is used for providing multiple language models and obtaining transaction-level data information and language call instructions according to the second state information and the corresponding language models and further used for generating and sending the time sequence control information according to an algorithm returned by the high-level language model. The high-level language model is used for obtaining and returning corresponding algorithms according to the transaction-level data information and the language call instructions. The application range is wide, and the testing efficiency and the precision of the testing result are improved.

Description

technical field [0001] The invention relates to the technical field of chip design, in particular to a simulation verification system. Background technique [0002] With the continuous development of the field of process technology, the application of chips is becoming more and more extensive. In the process of chip design, functional verification is a necessary link, and as the complexity of chips continues to increase, the monitoring and control that the verification platform for chip verification needs to support becomes more and more complex. . More importantly, for ultra-large-scale chips, it is not only necessary to evaluate and compare the functions and performance of the chip itself with the reference model, but also to build a complete system with the chip and its external models for simulation verification. [0003] In the prior art, the simulation verification system adopted when the chip is simulated and verified is a pure Verilog verification platform, and the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 李拓周恒钊符云越
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products