Imaging method of hard X-ray grating interferometer with single exposure
A technology of grating interferometry and imaging method, applied in the field of hard X-ray imaging physics, can solve the problems that hinder the popularization and application of hard X-ray grating interferometer, increase radiation dose and radiation damage risk, and long data acquisition time, etc., so as to reduce radiation damage risk, avoidance of high radiation doses, effects of reduced experiment time
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[0038] like figure 1 As shown, the hard X-ray grating interferometer includes: X-ray source 1, source grating 2, phase grating 3, analysis grating 4, detector 5; The imaging object 6; the source grating 2 is placed close to the X-ray source 1; the imaged object 6 is placed close to the inner side of the phase grating 3; an analysis grating 4 is arranged outside the phase grating 3; The axial distance is d; the detector 5 is closely attached to the outside of the analysis grating 4; in this embodiment, the imaging method of the hard X-ray grating interferometer for one exposure is carried out according to the following steps:
[0039] Step 1. Fix any two gratings in the source grating 2, the phase grating 3 and the analysis grating 4, and move the third grating along the moving direction by a quarter of the grating period, so that the hard X-ray grating interferometer works The point is fixed at the left half waist or right half waist position of the light intensity curve ( ...
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