Electron back scattering diffraction sample electrolytic polishing device

Abstract

The invention discloses an electron back scattering diffraction sample electrolytic polishing device. The device comprises an electrolytic tank, an electrolyte storage tank, a cleaning liquid storage tank, an anode rod, a cathode plate and a direct-current power source. An upper cover is arranged on an opening of the top of the electrolytic tank, the anode rod is connected to the upper cover in a lifting mode, the cathode plate is arranged at the bottom of the electrolytic tank, a cavity is formed in the cathode plate, a plurality of spraying holes communicated with the cavity are formed in the upper end face of the cathode plate, the bottom of the cathode plate is connected with a hollow pipe communicated with the cavity, the bottom of the electrolyte storage tank is connected with the hollow pipe through an electrolyte conveying pipe, and the bottom of the cleaning liquid storage tank is connected with the hollow pipe through a cleaning liquid conveying pipe; the side wall of the upper portion of the electrolytic tank is communicated with the electrolyte storage tank through an electrolyte overflow pipe, the side wall of the lower potion of the electrolytic tank is communicated with the electrolyte storage tank through an electrolyte backflow pipe, and the side wall of the lower portion of the electrolytic tank is communicated with the cleaning liquid storage tank through a cleaning liquid backflow pipe. The electrolytic polishing device is compact in structure, good in convection effect and uniform in electrolytic polishing.

Description

technical field [0001] The invention relates to the field of electrolytic polishing, in particular to an electrolytic polishing device for electron backscattered diffraction samples. Background technique [0002] As an orientation imaging analysis technique, electron backscatter diffraction (EBSD) technique is widely used in the analysis of material micro-morphology and micro-orientation. Since the EBSD observation signal comes from the extremely shallow surface layer of the material surface, the requirements for the sample are relatively high, and the surface of the sample is required to have conductivity, smoothness, no stress layer, no oxide film, and no continuous corrosion pits. Among various EBSD sample preparation methods, electropolishing after mechanical polishing is the fastest and cheapest method for preparing EBSD samples of metal materials. [0003] In laboratory scientific research, the simple EBSD sample electropolishing device includes anode, cathode, stirre...

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Problems solved by technology

The electrode spacing structure of the device is relatively complex

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