Point-cloud-model-based precise detection method and system for surface profile
A technology of point cloud model and cloud model, which is applied in the direction of measuring devices, image data processing, instruments, etc., can solve the problems of free-form surface and complex surface evaluation difficulties, unsatisfactory requirements, low measurement accuracy and efficiency, etc., and achieve high precision The demand for profile error evaluation, the improvement of accuracy and efficiency, and the effect of simple methods
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[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0043] Such as figure 1 As shown, it is a method for accurately detecting surface contour based on a point cloud model disclosed in Embodiment 1 of the present invention, including:
[0044] S101, establishing a theoretical point cloud model of the workpiece to be tested;
[0045] When it is necessary to accurately detect the surface profile of the workpiece to be measured, the theoretical point cloud model of the workpiece to be measured is obtained by using...
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