Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Point-cloud-model-based precise detection method and system for surface profile

A technology of point cloud model and cloud model, which is applied in the direction of measuring devices, image data processing, instruments, etc., can solve the problems of free-form surface and complex surface evaluation difficulties, unsatisfactory requirements, low measurement accuracy and efficiency, etc., and achieve high precision The demand for profile error evaluation, the improvement of accuracy and efficiency, and the effect of simple methods

Inactive Publication Date: 2016-12-21
SUZHOU UNIV
View PDF7 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the study of contour error evaluation, research methods such as plane and spherical surfaces have been relatively mature, but there are still great difficulties in the evaluation of free-form surfaces and complex surfaces. The measurement accuracy and efficiency are low and cannot meet the requirements
Compared with traditional measurement methods, coordinate measuring machine (CMM) has the advantages of high precision and programmable control, so it is widely used in the shape detection of parts with high precision requirements, but its precision is greatly affected by the measurement strategy, and there are The problem that the measurement coordinate system and the design coordinate system do not coincide

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Point-cloud-model-based precise detection method and system for surface profile
  • Point-cloud-model-based precise detection method and system for surface profile
  • Point-cloud-model-based precise detection method and system for surface profile

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0043] Such as figure 1 As shown, it is a method for accurately detecting surface contour based on a point cloud model disclosed in Embodiment 1 of the present invention, including:

[0044] S101, establishing a theoretical point cloud model of the workpiece to be tested;

[0045] When it is necessary to accurately detect the surface profile of the workpiece to be measured, the theoretical point cloud model of the workpiece to be measured is obtained by using...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a point-cloud-model-based precise detection method for a surface profile. The method comprises: a theoretical point cloud model of a to-be-measured workpiece is established; a practical point cloud model of the to-be-measured workpiece is measured; registering of the theoretical point cloud model and the practical point cloud model of the to-be-measured workpiece is completed; feature extraction is carried out on the theoretical point cloud model to obtain a normal feature; and a profile error of the theoretical point cloud model and the practical point cloud model is calculated. According to the invention, the method that is simple and practical and can be executed rapidly can be applied to profile detection of any model; and the universality is high. The industrial profile detection precision and efficiency are improved simultaneously; and the demand of high-precision profile error evaluation can be satisfied. In addition, the invention also discloses a point-cloud-model-based precise detection system for a surface profile.

Description

technical field [0001] The invention relates to the field of test and measurement technology, instruments and precision detection technology, in particular to a method and system for accurate detection of surface profile based on a point cloud model. Background technique [0002] With the development of digital design and industrial 4.0 intelligent manufacturing, free-form or complex surfaces are widely used in aerospace, biomedicine, automobile, shipbuilding, mold and other industrial fields, and the requirements for the processing quality of precision parts are also getting higher and higher. Therefore, it is very important to conduct high-precision and high-efficiency profile error evaluation for free-form or complex-surface parts. The main research of profile detection is the evaluation of surface profile error. The surface profile error is the allowable variation of the measured profile surface from the theoretical profile surface. It is divided into surface profile err...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B21/20G06T19/20
CPCG01B21/20G06T19/20
Inventor 陈国栋吴炎凡王正王振华孙立宁
Owner SUZHOU UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products