Manual scanning electron microscope electron backscatter in-situ stretching device

A technology of electron backscattering and in-situ stretching, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of influence of motor vibration experiment results, cost increase, and high risk of electron microscopy, etc., and achieve high structural stability and high precision. The effect of small experimental error and simple operation

Inactive Publication Date: 2016-12-14
SOUTHWEST JIAOTONG UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, the cost of the experiment is greatly increased, and the risk to the electron microscope during the experiment is also greater.
However, due to the use of motor drive, the vibration of the motor during the experiment will have an impact on the experimental results.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Manual scanning electron microscope electron backscatter in-situ stretching device
  • Manual scanning electron microscope electron backscatter in-situ stretching device
  • Manual scanning electron microscope electron backscatter in-situ stretching device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0028] Such as figure 1 , figure 2 , image 3 and Figure 4 The electronic backscattering in-situ stretching device shown in the manual scanning electron microscope includes a slider 4, the left and right sides of the slider 4 are respectively provided with a fixing seat 2 and a supporting seat 5, the outer side of the fixing seat 2 is provided with a screw 1, and the center of the slider 4 is provided There is a ball screw nut 3, and a radial bearing 6 is arranged inside the support seat 5; a chuck 7 is installed at the front end of the fixed seat 2 and the slider 4, and the sample 8 is clamped on the chuck 7; the middle position of the side of the fixed seat 2 is set There is a lock nut 9 to prevent the ball screw from falling off; one side of the fixed seat 2 is provided with a worm 10, and the other side of the fixed seat 2 is provided with a deep groove ball bearing 15; the bottom of the worm 10 is provided with a knob 12; the inside of the support seat 5 is provided w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a manual scanning electron microscope electron backscatter in-situ stretching device. The device comprises a slider; left and right sides of the slider are respectively provided with a fixing seat and a supporting seat; the slider is internally provided with a ball screw nut; the outer sides of the fixing seat and the supporting seat are provided with screws, and the insides are respectively provided with a radial bearing; a ball screw is connected between the fixing seat and the supporting seat; the ball screw is provided with a locking nut to prevent the ball screw from falling off; the ball screw is connected with a turbine; the fixing seat and the front end of the slider are provided with chucks for clamping samples; the fixing seat is internally provided with a deep trench ball bearing; one side of the supporting seat is provided with a worm, the inside is provided with an angular contact ball bearing, and the worm bottom is provided with a knob. The invention has the characteristics of few mounting parts, small size, simple and compact structure and simple operation. Many supporting parts used in the invention have been fully market-oriented, and the components are standardized, so the structural stability is high, and the experimental error is small.

Description

technical field [0001] The invention relates to a manual scanning electron microscope electronic backscattering in-situ stretching device, which belongs to the technical field of microscale mechanical performance testing. Background technique [0002] With the development of modern material science, nanomaterials, biological and medical materials, traditional tensile experiments and detection methods can no longer meet the development trend of materials science. While performing the tensile / compression test on the sample, it is particularly important to pass the test on the microstructure and mechanical properties of the sample. Moreover, since the feature scale of samples is getting smaller and smaller, there is an urgent need to study a tensile / compression testing machine with small size, precise structure, reliable data, and installation under an electron microscope. The current research on in-situ tensile mechanical testing by applying tension / compression methods has be...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N3/08
CPCG01N3/08G01N2203/005
Inventor 刘鹏飞范端陈友忠
Owner SOUTHWEST JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap