Multi-node AC test method implemented by aid of fatigue test machines matched with 4U jigs

Abstract

The invention discloses a multi-node AC test method implemented by the aid of fatigue test machines matched with 4U jigs, and belongs to the field of server test technologies. The multi-node AC test method implemented by the aid of the fatigue test machines matched with the 4U jigs includes executing test scripts on main test nodes and enabling the main test nodes to execute waiting operation if detected auxiliary test nodes are in on startup and shutdown states; enabling the main test nodes to execute shutdown operation if the detected auxiliary test nodes are in off startup and shutdown states; carrying out AC power off after the main test nodes detected by the fatigue test machines are shut down, keeping time for power-off time delay and powering up the test nodes again after the time for the power-off time delay of the fatigue test machines is up. The power-off time delay is set for the fatigue test machines. The multi-node AC test method implemented by the aid of the fatigue test machines matched with the 4U jigs has the advantages that test resources can be scientifically and reasonably utilized, the test efficiency can be improved, and accordingly the multi-node AC test method has excellent popularization application value.

Description

technical field [0001] The invention relates to the technical field of server testing, and specifically provides a method for realizing multi-node AC testing with a fatigue testing machine matched with a 4U fixture. Background technique [0002] Currently, there are two methods for performing AC tests on RACK nodes. One is to perform AC tests on a single RACK node through an AC fatigue tester; the other is to perform AC tests by controlling the RACK entire cabinet node. At present, both of the above two methods have some disadvantages. When using the first method for testing, only the AC test can be performed on a single RACK node, and there are few test samples; when using the second method for testing, it needs to occupy the entire RACK cabinet. Resources, the entire cabinet needs to be powered on and off, so if the nodes on the same cabinet have a test arrangement, they cannot continue, and cannot be synchronized with the AC test, and the test cannot be flexibly arranged ...

AI Technical Summary

Problems solved by technology

At present, both of the above two methods have some disadvantages. When using the first method for testing, only the AC test can be performed on a single RACK node, and there are few test samples; when using the second method for testing, it needs to occupy the entire RACK cabinet. Resources, the entire cabinet needs to be powered on and off, so if the nodes on the same cabinet have a test arrangement, they cannot continue, and cannot be synchronized with the AC test, and the test cannot be flexibly arranged and utilized reasonably and effectively , wasting test resources and reducing test efficiency

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