Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test case set reduction method based on program slice

A technology of test case sets and test cases, applied in software testing/debugging, error detection/correction, instruments, etc., can solve problems such as deletion and affecting the error detection ability of test case sets, so as to achieve simple calculation process and save test time and work The effect of small amount, space and time complexity

Inactive Publication Date: 2016-11-09
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
View PDF3 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The redundant test cases in the test case set must be deleted. This is done to ensure the efficiency of software testing and development benefits. However, redundant test cases cannot be deleted blindly, because some redundant test cases will affect the reduction. Post-use case set error detection capability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test case set reduction method based on program slice
  • Test case set reduction method based on program slice
  • Test case set reduction method based on program slice

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0020] Through the program slicing algorithm of inter-procedural function calls, an intra-procedural slicing algorithm is given on the basis of the slicing algorithm. Based on the above-mentioned program slicing algorithm and GRE algorithm, this embodiment proposes a test case set reduction method. The test case set reduction method is recorded as the GRE-R-T algorithm. The GRE-R-T algorithm combines the test requirement reduction and the test case set reduction. Combining, generating a test case set corresponding to the statement in the slice, and finally reducing the test case set according to the GRE-R-T method.

[0021] attached figure 1 The flow chart of the slice algorithm based on the function call program, as attached figure 1 As shown, the program slicing algorithm mainly includes the following steps:

[0022] Step 1: Add the key points of the slice to be obtained into the node set N, and add the variables corresponding to the key points into the variable set V; acc...

test Embodiment Ne

[0035] 3) According to the definition, find out the essential test case Nec(T) and add it to the reduced test case set T', and delete the satisfied test requirements; delete the redundancy from T according to the coverage of the test cases to the test requirements Test case Red(T), until there are no essential test cases and redundant test cases in T;

[0036] 4) Regarding the GRE-R-T algorithm, find out |R(t i )|The largest test case, find out |R(t according to the complementary relationship between the test case sets m )∪R(t n )|The largest two test cases, if|R(t i )|m )∪R(t n )|, choose t m and t n Join to T', otherwise choose t i ; and delete satisfied test requirements until all test requirements are satisfied.

[0037] The specific implementation of the GRE-R-T algorithm described in this embodiment is as follows:

[0038] First input: the relationship between test cases and test requirements TR[n][m]; matrix representation, the number of test case sets n=|T|, th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test case set reduction method based on a program slice, and relates to the field of software testing. The test case set reduction method is based on a program slice algorithm and a GRE algorithm and is recorded as a GRE-R-T algorithm. Test requirement reduction and test case set reduction are combined. Firstly, test requirements are subjected to slice calculation, an obtained slice and a program associated with the test requirements are combined to generate a test case set corresponding to statements in the slice, and finally, the test case set is subjected to reduction according to the GRE-R-T method. Compared with a traditional algorithm, the GRE-R-T algorithm is characterized in that the test case set is effectively subjected to the reduction, an amount of detected bugs is not lowered, and test time and workloads are greatly saved.

Description

technical field [0001] The invention relates to the field of software testing, in particular to a method for reducing test case sets based on program slicing. Background technique [0002] Software testing is an important means to ensure software quality and reliability. In the software development process, due to the continuous modification and improvement of each module, the continuous addition and integration of each module, and the final verification of the reliability and effectiveness of the entire system, frequent regression testing is required. During this process, the test case set The number will be larger and larger, and the redundant test cases will be more and more. In order to improve the efficiency of software testing and reduce the cost of testing, it is necessary to reduce the test case set. [0003] In the actual software development process, because the test cases are generated in stages or newly generated due to the continuous change of the software ver...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 方雪静
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products