Testing system for aiming at 80C186 architecture interface board

Abstract

The invention relates to a testing system for aiming at an 80C186 architecture interface board. The testing system comprises an FPGA least system circuit, a communication interface circuit, an Arinc429 signal transmitting circuit and a sequential logic control circuit. The FPGA least system is mainly composed of seven small parts, namely a clock input circuit, a resetting input circuit, a JTAG interface circuit, a program configuring circuit, a voltage supply circuit, a phase-locked loop circuit and an indicating lamp circuit. In the communication interface circuit, because a hardware language in which a serial-port communication protocol can be built is utilized on the FPGA, a corresponding adapter interface chip is utilized for RS232, RS422 and RS485 interface communication in the communication interface circuit. The testing system can supply a testing facility and a testing method for interface board testing of the 80C186 processor architecture board, thereby realizing quick product fault positioning, shortening mending period and ensuring high product quality.

Description

technical field [0001] The invention relates to the technical field of interface board testing methods, in particular to a testing system for an 80C186 architecture interface board. Background technique [0002] For the circuit module of the airborne 80C186 processor, the processor is equipped with a corresponding ROM configuration chip and self-starting clock, and its work cannot be controlled during the test. In the test and repair, the usual method is to power on the circuit board. , use oscilloscopes, multimeters and other testing instruments to test the input and output conditions to judge whether the board is good or bad; or use the test equipment that has passed the product. The faulty board is switched out, and then the first method is used for further test and diagnosis. [0003] Both of the above two test methods have certain limitations. It is difficult to control the entire board by only adding electrical signals locally. Only a simple test can be performed on a...

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Problems solved by technology

[0003] Both of the above two test methods have certain limitations. It is difficult to control the entire board by only adding electrical signals locally. Only a simple test can be performed on a specific part to solve some faults. In addition, due to the incomplete injection of signals, it is easy to damage to the board

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