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TaMKK3-A gene-based dCAPS molecular marker and method for detecting wheat head germination resistance

A technology of molecular markers and genes, applied in the determination/inspection of microorganisms, biochemical equipment and methods, DNA/RNA fragments, etc., can solve the problems of expensive instruments, high cost, unsuitable for mass material testing, etc., and achieve cost reduction , the effect of simplified detection techniques

Inactive Publication Date: 2016-10-26
ANHUI AGRICULTURAL UNIVERSITY
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AI Technical Summary

Problems solved by technology

[0004] However, the current single nucleotide detection technology is costly and the instruments used are relatively expensive, which is not suitable for the detection of large quantities of materials

Method used

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  • TaMKK3-A gene-based dCAPS molecular marker and method for detecting wheat head germination resistance
  • TaMKK3-A gene-based dCAPS molecular marker and method for detecting wheat head germination resistance
  • TaMKK3-A gene-based dCAPS molecular marker and method for detecting wheat head germination resistance

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Embodiment 1

[0021] 1 material

[0022] The methods used in this example are conventional methods known to those skilled in the art unless otherwise specified. The reagents and other materials used are commercially available products unless otherwise specified, and the germplasm resources used can be obtained from national species. quality resource library.

[0023] 2 methods

[0024] 2.1 Validation of MKKAC marker in 260 wheat variety resources

[0025] 2.1.1 Ear germination phenotype test

[0026] During the period from 2012 to 2015, 260 wheat varieties were selected for panicle germination phenotype testing. The specific steps are as follows:

[0027] (1) Determination of seed germination index (GI)

[0028] The main stem and ear materials of wheat were harvested at the wax maturity stage of wheat, air-dried indoors for 2 days, and immediately stored in a -20 °C refrigerator to maintain the dormancy of seeds. 10 main stems and panicles with the same maturity stage were selected, th...

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Abstract

The invention discloses a TaMKK3-A gene-based dCAPS molecular marker and a method for detecting wheat head germination resistance. According the method, based on wheat 4AL chromosome dormant candidate gene TaMKK3-A gene functional SNP, a dCAPS-labeled MKKAC is developed. The method comprises that based on a CAPS label, through introduction of a mismatched base to amplification primers, an HpyCH4IV cleavage site is introduced to a functional SNP label of the TaMKK3-A gene related to wheat head germination resistance so that an amplified spectrum band of the wheat material with head germination resistance has the HpyCH4IV cleavage site and the wheat material with head germination response does not contain the cleavage site. The label is used for wheat head germination resistance molecular marker-assistant breeding and realizes effectively distinguishing of materials with different head germination resistances so that the SNP detection technology is simplified and a detection cost is reduced.

Description

technical field [0001] The present invention relates to the technical field of wheat molecular breeding, in particular to a dCAPS molecular marker based on TaMKK3-A gene and a method for detecting wheat ear germination resistance. Background technique [0002] Wheat ear sprouting (Pre-harvest sprouting, PHS) refers to the phenomenon that wheat grains germinate directly on the ear due to rain or high temperature and humidity before harvest. Pre-harvest ear germination in wheat can severely reduce yield and quality stability (Groos et al., 2002; Chang et al., 2010). The longer the continuous rainy weather before harvest, the more serious the damage to the ear germination. Therefore, breeding wheat varieties with persistent ear germination resistance can help reduce this risk. Mining more panicle germination resistance genes, developing functional markers, and aggregation of different panicle germination resistance genes will help breed wheat varieties with strong panicle ger...

Claims

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Application Information

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IPC IPC(8): C12Q1/68C12N15/11
CPCC12Q1/6895C12Q2600/13C12Q2600/156
Inventor 朱玉磊王升星张海萍常成吴曾云姜昊曹佳佳刘凯秦朦卢杰司红起马传喜
Owner ANHUI AGRICULTURAL UNIVERSITY
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