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Multi-DUT (Device under Test) testing system and testing method thereof

A test system and test method technology, applied in transmission systems, transmission monitoring, electrical components, etc., can solve problems such as test software management confusion, achieve the effects of improving test efficiency, reducing purchase costs, and simplifying test steps

Inactive Publication Date: 2016-09-28
SHENZHEN ATUE TECH CO LTD
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a multi-DUT test system, which can not only be compatible with the test schemes of various chips in DUT products, but also can automatically select and adjust corresponding test software according to different wireless testers, thereby solving the problem of Test software management chaos, and significantly improve test efficiency

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  • Multi-DUT (Device under Test) testing system and testing method thereof
  • Multi-DUT (Device under Test) testing system and testing method thereof

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0026] see figure 1 , is a schematic structural diagram of the multi-DUT testing system of the present invention. The multi-DUT testing system includes a PC 10 , multiple DUTs 11 and a wireless tester 12 . In a preferred embodiment of the present invention, both the PC 10 and the wireless tester 12 are one. The PC 10 is respectively connected to the DUT 11 and the wireless tester 12 through a network cable. Specifically, the PC 10 is connected to the wireless tester 12 using the TCP / IP protocol. The wireless connection between the DUT 11 and the wireless tester 12 is realized through radio frequency signals.

[0027] The PC 10 controls the DUT11 to send radio frequency signals at a specified frequency, data transmission rate and channel according to the chip type in the DUT11. In a preferred embodiment of the present invention, the PC 10 also control...

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Abstract

The invention provides a multi-DUT (Device under Test) testing system, which comprises a PC (Personal Computer), a plurality of DUTs and a wireless tester, and is characterized in that the PC is connected with the plurality of DUTs in a communication mode and controls the DUTs to give out radio frequency signals at the specified frequency, data transmission rate and channel according to the chip type in the DUTs, the wireless tester receives the radio frequency signals given out by the DUTs and gives out feedback signals, and the PC receives the feedback signals given out by the wireless tester and adjusts index parameters of the DUTs according to the feedback signals. Compared with the prior art, the multi-DUT testing system provided by the invention not only can be compatible with testing schemes of various chips in DUT products, but also can automatically select corresponding testing software according to different wireless testers, thereby solving a problem that management for the testing software is disordered, and significantly improving the testing efficiency.

Description

technical field [0001] The invention relates to the technical field of DUT testing, in particular to a multi-DUT testing system and a testing method thereof. Background technique [0002] Optical Network Unit ONU (Optical Network Unit), ONU is divided into active optical network unit and passive optical network unit. Generally, the equipment equipped with optical receivers, uplink optical transmitters, and multiple bridge amplifiers for network monitoring is called an optical node. The passive optical network PON is connected to an optical line terminal OLT using a single optical fiber, and then the optical line terminal OLT is connected to an optical network unit ONU. The optical network unit ONU provides services such as data and interactive Internet TV (IPTV), and voice uses integrated access device IAD (Integrated Access Device), truly realizing the "triple-play" application of voice, data, and digital TV. The core device of the optical network unit ONU is the optical ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/29H04B17/24H04B17/10
CPCH04B17/29H04B17/102H04B17/24
Inventor 余广兴
Owner SHENZHEN ATUE TECH CO LTD
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