Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

HARQ feedback method, HARQ feedback device, base station and terminal

A feedback device and terminal technology, applied in the field of communication

Active Publication Date: 2016-09-07
MEIZU TECH CO LTD
View PDF8 Cites 26 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Based on the above problems, the present invention proposes a design scheme for determining the HARQ feedback timing of a TDD system using sTTI according to the HARQ feedback timing of a TDD system using legacy TTI, so as to solve the problem of HARQ ACK or NACK feedback in the case of using sTTI Timing Design Issues

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • HARQ feedback method, HARQ feedback device, base station and terminal
  • HARQ feedback method, HARQ feedback device, base station and terminal
  • HARQ feedback method, HARQ feedback device, base station and terminal

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] In the TDD system using sTTI, for data sent on P sTTI subframes corresponding to legacy TTI subframe n, HARQ ACK or NACK is sent on P sTTI subframes corresponding to legacy TTI subframe m Feedback information, wherein the correspondence between the legacy TTI subframe n and the legacy TTI subframe m is determined according to the HARQ feedback timing of the TDD system using legacy TTI, and n and m are integers from 0 to 9.

[0045]In this technical solution, a design scheme of the HARQ feedback timing of the TDD system using sTTI determined according to the HARQ feedback timing of the TDD system using legacy TTI defined in the standard can be: in the HARQ feedback timing of the TDD system using legacy TTI It is stipulated in the sequence that for the data sent on the legacy TTI subframe n, the HARQ ACK or NACK feedback information is correspondingly sent on the legacy TTI subframe m, and it is correspondingly specified in the HARQ feedback sequence of the TDD system usin...

Embodiment 2

[0047] In the TDD system using sTTI, for data sent on k×P sTTI subframes corresponding to legacy TTI subframes n1, n2,..., nk, in P sTTI subframes corresponding to legacy TTI subframe m HARQ ACK or NACK feedback information is sent on the subframe, wherein the correspondence between the legacyTTI subframes n1, n2, ..., nk and the legacy TTI subframe m is determined according to the HARQ feedback timing of the TDD system using legacy TTI , n1, n2..., nk and m are integers from 0 to 9, and k is an integer greater than or equal to 2.

[0048] In this technical solution, another design scheme of the HARQ feedback timing of the TDD system using sTTI determined according to the HARQ feedback timing of the TDD system using legacy TTI defined in the standard can be: in the HARQ of the TDD system using legacy TTI It is stipulated in the feedback timing that, for the data sent on the legacy TTI subframe n1,...,nk, the HARQ ACK or NACK feedback information is sent on the legacy TTI subfr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a HARQ feedback method, a HARQ feedback device, a base station and a terminal, wherein the HARQ feedback method comprises the following steps of: determining a HARQ feedback time sequence of a TDD system adopting a sTTI according to a HARQ feedback time sequence of a TDD system adopting a legacy TTI, wherein the sTTI is formed by dividing the legacy TTI into P TTIs having shorter duration; and P is an integer, which is greater than or equal to 2; and performing HARQ feedback of received data according to the determined HARQ feedback time sequence of the TDD system adopting the sTTI. By means of the technical scheme of the invention, the design problem of a HARQ ACK or NACK feedback time sequence when the sTTI is used can be solved.

Description

technical field [0001] The present invention relates to the field of communication technology, in particular, to a HARQ feedback method, a HARQ feedback configuration device, a base station and a terminal. Background technique [0002] At present, with the development of the mobile Internet, a large number of application services satisfying various specific functions have emerged. Some of these services have lower requirements on data latency, such as sending and receiving emails, downloading movies, etc.; but some other services have strict requirements on data latency, such as online games, snapping up, grabbing red envelopes, etc. These services usually require The delay of user data should be as short as possible. In an LTE (Long Term Evolution, Long Term Evolution) system, a Transmission Time Interval (TTI, Transmission Time Interval) is an important indicator affecting user data delay. The transmission time interval adopted by the current LTE system is 1 ms (hereinaf...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H04L5/00H04L1/18
Inventor 不公告发明人
Owner MEIZU TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com