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A Nanoparticle Size Measurement Method Based on Partial Differential Equation

A partial differential equation and nanoparticle technology, which is applied in the field of measurement of nanoparticle size, can solve problems such as unsatisfactory image segmentation effects, achieve automatic analysis and evaluation, good segmentation effects, and improve efficiency and accuracy

Active Publication Date: 2019-03-15
思腾合力(天津)科技有限公司
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  • Claims
  • Application Information

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Problems solved by technology

Li et al. (see literature 3) proposed the DRLSE model, and Chan and Vese (see literature 4) proposed the CV model, but these two segmentation models are not ideal for image segmentation with weak edge objects

Method used

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  • A Nanoparticle Size Measurement Method Based on Partial Differential Equation
  • A Nanoparticle Size Measurement Method Based on Partial Differential Equation
  • A Nanoparticle Size Measurement Method Based on Partial Differential Equation

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Embodiment Construction

[0055] The present invention will be further described in detail below in combination with specific embodiments.

[0056] Processing and analyzing nanoparticle images based on image processing technology is an important method for nanoparticle size measurement, and individual particle segmentation is a key step in particle size measurement. Due to the uneven gray scale of nanoparticles in TEM images, and the edges of some particles are weak, it is very important to accurately segment individual particles. In recent years, a branch of image processing methods for partial differential equations—the level set image segmentation method has become a research hotspot. This method implicitly represents the edge evolution curve as a zero level set of a higher-dimensional function. The level set function is in Under the control of partial differential equations, it evolves until the zero level set evolves to the target boundary of the image. This kind of evolution has many advantages,...

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Abstract

The invention discloses a nanoparticle size measurement method based on partial differential equations, which includes: 1) inputting a nanoparticle image I, performing pixel-level multiplication of the filtering results of the average curvature flow model and the PM model to obtain a filtered image u; 2) Use the local region fitting model (RSF) to segment the image u; 3) Pixel calibration to obtain the actual size corresponding to each pixel in the image; 4) Use the convexity C of the target conv Select non-adhesive particles; 5) Obtain the diameter of spherical nanoparticles by performing least square circle fitting on the particle boundaries, and at the same time obtain the inscribed circle diameter r c , circumscribed circle diameter r i , and the sphericity of nanoparticles. The present invention can be widely used in high-tech fields that require nanoparticle size measurement technology, such as catalytic science, medical drugs, new materials, power industry, and composite materials.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to a method for measuring the size of nanoparticles based on partial differential equations, which can be used for measuring the size of nanoparticles. Background technique [0002] Nanotechnology is widely used in catalytic science, medical drugs, new materials, electric power industry and composite materials, and plays an important role in the entire high-tech field (see Document 1). Since many characteristics of nanomaterials are closely related to their particle size, shape and other microstructures, the characterization of nanomaterials microstructure is of great importance for understanding the characteristics of nanomaterials, seeking the application fields of nanomaterials, and promoting the development of nanomaterials. important role, and the size measurement of nanoparticles is one of the key technologies. At present, methods for measuring the size of nanoparticle...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/60G06T5/00G06T7/10
CPCG06T2207/20024G06T2207/10061G06T5/70
Inventor 张芳肖志涛王萌耿磊吴骏王雯陈颖
Owner 思腾合力(天津)科技有限公司
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