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Chip test method and chip test device

A technology for chip testing and chips to be tested, applied in measuring devices, electronic circuit testing, measuring electricity, etc., and can solve problems such as poor compatibility of chip testing devices

Active Publication Date: 2016-08-31
ANALOGIX SEMICON (SUZHOU) INC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Embodiments of the present invention provide a chip testing method and device to at least solve the technical problem of poor compatibility of chip testing devices in the prior art

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  • Chip test method and chip test device

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Embodiment Construction

[0028] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0029] It should be noted that the terms "first" and "second" in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and not necessarily used to describe a specific sequence or sequence. It should be understood that the data used in this way can be interchanged under ap...

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Abstract

The invention discloses a chip test method and a chip test device. The chip test device comprises the test equipment, a chip test circuit board, an input interface which is arranged on the chip test circuit board, is connected with the test equipment and is used for carrying out data transmission between the test equipment and the chip test circuit board, and a controller which is arranged on the chip test circuit board, is connected with a to-be-tested chip and the input interface, is used for acquiring a state instruction of the input interface and determining a corresponding test vector according to the state instruction, wherein the controller is further used for sending a work mode corresponding to the test vector to the to-be-tested chip to make the to-be-tested chip operate in a work mode, the controller is further used for acquiring a work state of the to-be-tested chip operating in the work mode and determining a detection result of the to-be-tested chip according to the work state. Through the method and the device, a technical problem of poor compatibility existing in a chip test device in the prior art is solved.

Description

Technical field [0001] The invention relates to the field of chip testing, and in particular to a method and device for chip testing. Background technique [0002] See figure 1 The chip testing device in the prior art basically completes the chip testing under the control of a computer. The above chip testing device is composed of three parts, namely a computer, a testing device, and a chip testing circuit board. The specific test process is: according to the function of the chip to be tested, the required test vector is compiled in the computer, and the converted program drives the signal pin of the test equipment to output the required signal, and then the chip test circuit board runs. The test method corresponding to the above chip test device has the following disadvantages: [0003] 1. Difficulty in debugging. The actual application environment of the chip and the test environment of the chip are very different, which leads to a series of debugging difficulties, such as the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G05B19/042
CPCG01R31/2851G05B19/0423G05B2219/24036
Inventor 郭春成郑又诚彭嘉庆
Owner ANALOGIX SEMICON (SUZHOU) INC
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