Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Surface emissivity measurement system

A technology of surface emissivity and measurement system, which is applied in the field of surface emissivity measurement system to achieve the effect of eliminating influence and high measurement accuracy

Inactive Publication Date: 2016-08-24
AECC SHENYANG ENGINE RES INST
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a surface emissivity measurement system to solve or at least alleviate at least one of the problems in the background art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Surface emissivity measurement system
  • Surface emissivity measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all, embodiments of the invention. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Embodiments of the present invention will be described in detail below ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a surface emissivity measurement system, and relates to the technical field of emissivity measurement. The surface emissivity measurement system comprises an infrared temperature measurement detector, a contact-type thermodynamic temperature sensor, a signal processing circuit and a computer; the contact-type thermodynamic temperature sensor is arranged on the surface of a target object to be measured, and transmits a surface thermodynamic temperature signal of the target object to be measured to the signal processing circuit; the infrared temperature measurement detector is arranged on the upper side of the target object to be measured, and transmits a radiation temperature signal of the surface of the target object to be measured to the signal processing circuit after the radiation temperature signal is processed; the signal processing circuit conditions the received signal, and then transmits the conditioned signal to the computer; the computer is used for performing calculating processing, data display and storage on the emissivity of the surface of the target object to the measured. The surface emissivity measurement system has the beneficial effects that the system is simple in structure and easy to install and maintain; a target material does not need to be sampled; the measurement precision is high.

Description

technical field [0001] The invention relates to the technical field of emissivity measurement, in particular to a surface emissivity measurement system. Background technique [0002] With the development of infrared technology, emissivity measurement technology has been used more and more in the fields of infrared stealth design, energy-saving material testing and solar power generation. The techniques currently used for emissivity measurement include calorimetry, reflectivity method and multi-wavelength method: calorimetry has high measurement accuracy and can continuously measure the emissivity of samples in a wide temperature range, but it needs to be The target material is sampled and the equipment is relatively complicated; the reflectance method can achieve the effect of non-contact measurement of emissivity, but it has high requirements for active light sources, and can only measure the target spectral emissivity within the wavelength range of the light source, which ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 于浩张志学张羽鹏薛秀生叶林葛俊锋桂康侯雷潘心正
Owner AECC SHENYANG ENGINE RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com