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Joint inversion method for metal terahertz-far infrared complex refractive indexes

A complex refractive index and far-infrared technology, which is applied in the measurement of phase influence characteristics, material analysis through optical means, instruments, etc., can solve the problems of limited measurement frequency points and poor stability, and achieve poor stability, high reliability, Inverts the effect of a wide spectral range

Active Publication Date: 2016-08-03
XIDIAN UNIV
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Problems solved by technology

In order to overcome the shortcomings of limited measurement frequency points and poor stability of the terahertz time-domain spectroscopy experimental system

Method used

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  • Joint inversion method for metal terahertz-far infrared complex refractive indexes
  • Joint inversion method for metal terahertz-far infrared complex refractive indexes
  • Joint inversion method for metal terahertz-far infrared complex refractive indexes

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Embodiment Construction

[0021] Attached below Figure 1-Figure 6 The present invention will be described in detail with specific embodiments.

[0022] The invention is a method for joint inversion of metal complex refractive index by using far-infrared ellipsometer and terahertz-far-infrared reflectance spectrum, which is divided into two parts: measurement and theoretical inversion. First, far-infrared ellipsometer and Fourier spectrometer are used to measure the exact solution of the complex refractive index in the far-infrared and the reflectance spectrum in the terahertz-far-infrared frequency band on the polished metal sample; then the theoretical inversion is carried out, and the inversion process It is: combined with the KK relationship between the amplitude and phase of the reflection coefficient, intercept the measured value of the ellipsometer near the high-frequency end of the terahertz as the initial value of the experiment, and adjust the exponential extrapolation parameters at the high-...

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Abstract

The invention provides a joint inversion method for metal terahertz-far infrared complex refractive indexes. A far infrared ellipsometer is used for measuring exact solutions of the complex refractive indexes with the wave number range of 262 cm<-1>-7,946 cm<-1>; in combination with a far infrared Fourier spectrograph, reflectivity spectrums of metal within the wave number range are measured; the complex refractive index, close to the terahertz high-frequency end, measured by the ellipsometer is selected as an experiment initial value, index extrapolation parameters are adjusted through the KK relation between the reflection coefficient range and phases till the inversion result and the ellipsometer complex refractive index calibration result meet error requirements, and the complex refractive indexes of the terahertz-far infrared metal are obtained. The accuracy of the inversion result is verified by comparing the inversion result with measured values at the same frequency band of the ellipsometer. According to the method, theories and experiments verify one another, the inversion result is high in reliability, the defect that complex refractive indexes of THz frequency bands are difficult to measure is overcome, and a research basis is provided for terahertz material scattering properties and development of the terahertz radar imaging technology.

Description

technical field [0001] The invention belongs to the field of terahertz to far-infrared medium material dispersion analysis and complex refractive index measurement, and relates to a method for jointly inverting metal complex refractive index by using far-infrared spectroscopic ellipsometer and Fourier reflectance spectrometer, which can be applied to the scattering characteristics of terahertz targets The research of radar radiation imaging and the system design of scale experiment etc. Background technique [0002] The terahertz (THz) domain is a not yet fully understood spectrum lying between the microwave and far-infrared spectrum. With the development of ultrafast laser technology, terahertz radiation and detection technology are becoming more and more mature, which has made important progress in the application of THz waves in the fields of industry, military, biology and medicine. At present, the application field of THz technology can be divided into two basic resear...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/41G01N21/3586G01N21/3581
CPCG01N21/3581G01N21/3586G01N21/41G01N2021/3595
Inventor 牟媛吴振森曹运华阳志强
Owner XIDIAN UNIV
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