High-temperature spectrum emissivity measuring method and device of infrared window

Abstract

The invention relates to a high-temperature spectrum emissivity measuring method and device of an infrared window. The device comprises a modulated type infrared radiation source, a monochromator and an integrating sphere, a probe hole of the integrating sphere is provided with a detector, the detector is connected with one port of a detection unit, the modulated type infrared radiation source is connected with one port of the detection unit, the detection unit is connected with a computer, a transmission heating furnace, the monochromator and a reflection heating furnace are connected with a control unit, and the control unit is connected with the computer. According to the invention, the high-temperature emissivity of the infrared window can be measured, problems in radiation temperature measurement of the infrared window are solved, interference in target radiation measurement caused by radiation of the infrared window itself is eliminated, and the measuring accuracy of an infrared detection system is improved. An annular heat conductive ceramic heating plate is combined with an insulated ceramic pressure plate to heat the infrared window, the temperature of a surface-mounted thermocouple is measured so that the temperature of the infrared window is controlled, the transmittance and reflectivity of the infrared window can be measured in the non room temperature condition, and the high-temperature emissivity of the infrared window is solved.

Description

technical field [0001] The invention relates to a high-temperature spectral emissivity measurement method aimed at an infrared window, belonging to the field of transmittance and emissivity measurement of infrared transparent materials. Background technique [0002] The infrared window is an optical window that can pass through infrared radiation. It is widely used in the measurement window of the infrared detection, imaging and navigation systems of high-speed aircraft or missiles. It transmits the infrared radiation information of the external measured target into the internal optical path of the system, while preventing The optical components and electronic devices inside the system are impacted and affected by the harsh external environment. When flying at high speed, the impact of the airflow causes the temperature of the infrared window to rise, and the infrared radiation generated by itself interferes with the infrared radiation of the target, affecting the accuracy o...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a high-temperature spectral emissivity measurement method suitable for infrared windows, which solves the problem that traditional spectral emissivity measurement methods based on FT-IR or IR-S cannot measure the high-temperature infrared window emissivity. The problem

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