Electronic component transparent medium turntable bearing testing and automatic wiping method

Abstract

The invention relates to an electronic component transparent medium turntable bearing testing and automatic wiping method. A turntable bearing an electronic component for testing is a turntable adopting a transparent medium or a turntable inlaid with a transparent medium, and the transparent medium turntable is provided with an automatic wiping and cleaning mechanism. The electronic component transparent medium turntable bearing testing and automatic wiping method adopts a positioning turntable, the transparent medium turntable, a cylinder, a testing probe and an automatic turntable wiping device. The method comprises the steps that: 1, a light-emitting surface of a component faces downwards, a pin surface faces upwards, a testing pin does not need to pass through the turntable and contact with pins of the component for test during the testing process, the probability that the testing pin is broken since it needs to pass through the turntable for test is reduced, the service life is prolonged, and action time of a testing assembly is shortened; 2, and the testing probe is installed under the transparent medium turntable, is stationary relative to the transparent medium turntable, the cleaning process of the transparent medium turntable does not affect position precision of the testing probe, and the accuracy and stability of test can be improved. Through verification and analysis, the device is fast in operation speed, convenient in adjustment, compact in structure and high in accuracy.

Description

Technical field: [0001] The invention relates to a novel testing method for electronic components, and further relates to a new turntable solution for carrying electronic components. Background technique: [0002] The turntable part is one of the main mechanisms of the spectrometer, which carries the testing process of electronic components, and undertakes the action flow of each main functional module of the equipment and the hierarchical relationship between each input and output. The main functional mechanisms form a sequential relationship around the turntable station. Complete the actions one by one. [0003] The test part of the component is the pin part. Generally, there are pins on the bottom surface, and the pins of some components extend to the side. They are distinguished according to the component test method. At present, the commonly used turntable forms can be divided into clamp test method and bottom test method Such as figure 1 It is a component clamping te...

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Problems solved by technology

[0003] The test part of the component is the pin part. Generally, there are pins on the bottom surface, and the pins of some components extend to the side. They are distinguished according to the component test method. At present, the commonly used turntable forms can be divided into clamp test method and bottom test method. like figure 1 It is a component clamping test method, the material is placed in the suction nozzle slot of the turntable, and the side pins of the component are used for testing during the test. The clamping test method has limitations, and it cannot be tested for components without pins on the side

like figure 2 It is a test method for the pins at the bottom of the component. Before testing, first debug to ensure that the test needle is aligned with the position where the nozzle of the turntable passes through the needle hole, so as to avoid the needle being broken due to deviation. The test needle must pass through the nozzle of the turntable during the test, and the test action time must be added. It takes time for the test needle to completely leave the turntable. This test method is difficult to debug and operate, with low efficiency, short probe life and high cost.

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