Method for measuring transmission rate of liquid adherent boundary layer under effect of external electric field
A measurement method and technology of boundary layer, applied in transmittance measurement and other directions, can solve problems such as transmittance measurement, and achieve the effect of improving accuracy, preventing the inability to obtain or accurately analyze the refractive index of liquid, and avoiding uneven liquid level.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.
[0039] The method for measuring the transmittance of the liquid-adhered boundary layer under the action of an external electric field according to the present invention comprises:
[0040] S1. Determine the area of the adherent boundary layer of the liquid according to the electric field strength and the thickness of the liquid in the direction of the incident light, and determine the incident position of the incident light on the sample chamber according to the area of the adherent boundary layer;
[0041] S2. Make the incident light incident along the direction perpendicular to the liquid surface and the electric field from the incident position, obtain the incident light intensity of the i...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
refractive index | aaaaa | aaaaa |
refractive index | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com