Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

High-precision measurement method of scratch area and grayscale parameter of IC card chip

A measurement method and high-precision technology, applied in the direction of spectrometry/spectrophotometry/monochromator, measuring device, color measuring device, etc., can solve the problem that the judgment result is not supported by scientific data

Active Publication Date: 2016-04-20
STATE GRID CORP OF CHINA +1
View PDF4 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, for a long time, the chip wear detection of the smart meter electricity purchase card is judged by the human eye, and the judgment result is not supported by scientific data.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision measurement method of scratch area and grayscale parameter of IC card chip
  • High-precision measurement method of scratch area and grayscale parameter of IC card chip
  • High-precision measurement method of scratch area and grayscale parameter of IC card chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The structural features of the present invention will now be described in detail in conjunction with the accompanying drawings.

[0025] see figure 1 , a kind of IC card chip scratch area and the high precision measuring method of gray scale parameter, carry out as follows:

[0026] Step 1: Prepare two power purchase card chips, one of which is used as a standard sample card, and the other is used as a chip for testing. Clean the standard sample card and the detection chip.

[0027] Step 2: Put the detection chip into the card slot of the smart meter for N consecutive insertions and removals, where the value of N ranges from 10 to 10,000. The standard sample card and the detection chip after N times of insertion and removal are respectively optically imaged by the CCD.

[0028] Step 3: Capture the optical imaging result of the standard sample card by the CCD and save it as a standard base map. The CCD captures images of the optical imaging results of the detection c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention brings forward a high-precision measurement method of a scratch area and a grayscale parameter of an IC card chip. The method comprises the following seven steps: before scratches are detected, a clean scratch-free electricity purchase card chip is acquired as a standard base graph through a CCD, another clean scratch-free electricity purchase card is taken and is inserted into a card slot for a plugging test, an electricity purchase card chip to be measured is scanned through the CCD, a comparison with the base graph is made, differences are analyzed, the differences are scratch information, the scratch information is analyzed by use of a certain algorithm, and thus the purpose of quantitative detection of the scratches is realized. The method provided by the invention has the following technical advantages: the problems of inconsistent man-eye observation and evaluation standards, large manual errors and the like can be overcome through the method, based on digital image processing, by use of a BLOB algorithm, the scratch area and the grayscale parameter are calculated, and scratch degree of the electricity purchase card is accurately and quickly analyzed in a quantitative mode.

Description

technical field [0001] The invention belongs to the technical field of device image detection, and in particular relates to a high-precision measurement method for IC card chip scratch area and gray scale parameters. Background technique [0002] With the widespread promotion of smart meters, the local fee control model has played an important role in electricity price recovery. Each local fee control meter is equipped with a power purchase card held by residents as a payment and recharge medium. The meter has a built-in card slot. Data exchange is performed after the electric card is inserted into the card slot. Since there are many card slot spring manufacturers, the material, spring pressure and other factors are all different, so the card slot spring may cause scratches and wear on the chip inserted into the power purchase card. Deep scratches and wear will lead to damage to the power purchase card chip. If there is permanent damage, users will not be able to purchase e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/28G01J3/46G01J3/50G01N19/04G06K9/46
CPCG01B11/28G01J3/462G01J3/50G01N19/04G06V10/56
Inventor 付真斌陈自年曾世杰陈晨蔺菲梁晓伟胡吕龙黄丹
Owner STATE GRID CORP OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com